2020
DOI: 10.1109/tsm.2020.2975300
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Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs

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Cited by 5 publications
(4 citation statements)
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“…This device has advantages such as high switching speed and good efficiency at low voltage levels [32]. In choosing MOSFETs, there are several parameters that become a major concern [33,34], namely: (1) RDS(on) is the resistance between drain and source when the MOSFET is in the ON position. ( 2) VGS(on) is the reference voltage used by the MOSFET to trigger the Gate which makes the MOSFET channel carry the maximum current.…”
Section: Ii3 Mosfetmentioning
confidence: 99%
“…This device has advantages such as high switching speed and good efficiency at low voltage levels [32]. In choosing MOSFETs, there are several parameters that become a major concern [33,34], namely: (1) RDS(on) is the resistance between drain and source when the MOSFET is in the ON position. ( 2) VGS(on) is the reference voltage used by the MOSFET to trigger the Gate which makes the MOSFET channel carry the maximum current.…”
Section: Ii3 Mosfetmentioning
confidence: 99%
“…where I di (t) and V dsi (t), respectively, represent the drain current waveform and the drain-source voltage waveform of Q i . In (29), t on ini is the time when V gsi changes to 10% of its final value, where V gsi is the gate-source voltage waveform of Q i , and t on fin is the time V dsi drops to 10% of its initial value. Similarly, t off ini denotes the time V gsi decreases to 90% of its on-state value, while t off fin is the instant at which V dsi increases to 90% of its off-state value.…”
Section: Table IV Extracted Mean and Standard Deviation Of Model Para...mentioning
confidence: 99%
“…Due to computational costs and the necessary modeling effort, statistical circuit designs can only consider the statistical variations of a few model parameters. Simultaneously, the statistical properties of the circuit of interest need to be represented accurately [29]. To the best of our knowledge, no prior study has discussed using a limited number of statistical model parameters to analyze Fig.…”
Section: Introductionmentioning
confidence: 99%
“…The golden device selection is not sufficiently discussed in the literature in the context of RF and microwave transistors [11]. Corner-based statistical modeling [12][13][14][15] is similar to the considered problem. Both tasks deal with parameter variation due to process imperfection.…”
Section: Introductionmentioning
confidence: 99%