2019
DOI: 10.1016/j.spmi.2018.03.008
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Statistical investigations of the film-substrate interface during aluminum deposition on Ni(111) by molecular dynamics simulation

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Cited by 11 publications
(5 citation statements)
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“…In addition, we note that the Uchida stacking motif does not need to distinguish between the atoms. We used the embedded atom method potential for Al-Al (Daw & Baskes, 1984), which is widely used in MD simulations for modelling metals and alloys (Hassani et al, 2019). The parameters were taken from the LAMMPS force field (Al_jnp.eam) developed by Jacobsen et al (1987).…”
Section: Simulation Methodsmentioning
confidence: 99%
“…In addition, we note that the Uchida stacking motif does not need to distinguish between the atoms. We used the embedded atom method potential for Al-Al (Daw & Baskes, 1984), which is widely used in MD simulations for modelling metals and alloys (Hassani et al, 2019). The parameters were taken from the LAMMPS force field (Al_jnp.eam) developed by Jacobsen et al (1987).…”
Section: Simulation Methodsmentioning
confidence: 99%
“…On the other hand, Chen constructed a much larger model and focused on the effects of film thickness, deposition temperature, deposition interval, and reflow temperature on the surface roughness of Cu films . Hassani et al and Wu et al applied MD simulations to study the deposition behaviors of Al and Ni on Ni(001), Ni(110), and Ni(111) substrates. The atom jumping behaviors on the substrate surface and the island coalescence progress are well described. More and more studies used MD simulation to obtain the simultaneous information during the deposition process. , …”
Section: Introductionmentioning
confidence: 99%
“…For example, the deposition of an AlNi film on a Ni surface was performed by MD simulations with different conditions [36,37]. Hassani et al [38] studied the interface of an Al film coating on a Ni sample using deposition process simulation. Fu et al [39] investigated the intermixing and hardness of a Cu film coating on Ni specimens by employing MD simulation technique.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, the upper atoms belong to the free group to interact with incident atoms. Table 1(a) displays the sputtering process parameters selected by referring to some reports [36][37][38]. The time step is 0.001 ps.…”
Section: Introductionmentioning
confidence: 99%