2015
DOI: 10.1109/tns.2015.2462754
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Statistical Modeling for Radiation Hardness Assurance: Toward Bigger Data

Abstract: New approaches to statistical modeling in radiation hardness assurance are discussed. These approaches yield quantitative bounds on flight-part radiation performance even in the absence of conventional data sources. This allows the analyst to bound radiation risk at all stages and for all decisions in the RHA process. It also allows optimization of RHA procedures for the project's risk tolerance.

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Cited by 11 publications
(2 citation statements)
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“…This generally requires circuit analysis to identify the most critical parameters for system operation. Standard methods for determining the dose failure distributions have been described in detail [1]- [3] as well as new methods that use Bayesian statistics [12] and techniques for building large data sets [13]. Adding to this particular literature is beyond the scope of this paper.…”
Section: B Device Total Dose Failure Distribution G(x)mentioning
confidence: 99%
“…This generally requires circuit analysis to identify the most critical parameters for system operation. Standard methods for determining the dose failure distributions have been described in detail [1]- [3] as well as new methods that use Bayesian statistics [12] and techniques for building large data sets [13]. Adding to this particular literature is beyond the scope of this paper.…”
Section: B Device Total Dose Failure Distribution G(x)mentioning
confidence: 99%
“…The main space radiation hazards of electronic components are single-event effect and full-dose ionization effect. Single-event effect is the impact of a single high-energy particle (heavy ions, protons, and neutrons) on the electronic components inside the device [3,4] , which causes damage to the sensitive area, resulting in charge damage and affecting the operating current, logic state, output data, and electrical performance of the device [5][6][7][8] . In this case, the sensitivity of the device chip to single-event transients will be further enhanced.…”
Section: Introductionmentioning
confidence: 99%