2023
DOI: 10.1016/j.nimb.2023.01.008
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Statistical nature of secondary electron emission

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Cited by 2 publications
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“…Besides those produced upon impact with the cone, SE are also generated from 𝑒 + impacting the grids, that are then accelerated into the cone at increasing energies as |𝑉 R4 | is reduced. The detection efficiency is related to the SE yield from the cone, which for a range of materials has been found to follow a log-normal distribution [26], and rises sharply as 𝐸 + increases. SE generated at R4 are always accelerated towards the CEM because the cone is positive with respect to R4, thus contributing to the non-zero offset in πœ€ 𝑑 + .…”
Section: Results and Analysismentioning
confidence: 99%
“…Besides those produced upon impact with the cone, SE are also generated from 𝑒 + impacting the grids, that are then accelerated into the cone at increasing energies as |𝑉 R4 | is reduced. The detection efficiency is related to the SE yield from the cone, which for a range of materials has been found to follow a log-normal distribution [26], and rises sharply as 𝐸 + increases. SE generated at R4 are always accelerated towards the CEM because the cone is positive with respect to R4, thus contributing to the non-zero offset in πœ€ 𝑑 + .…”
Section: Results and Analysismentioning
confidence: 99%