Status of MCT focal plane arrays in France

Vuillermet, Michel; Billon-Lanfrey, David; Reibel, Yann; Manissadjian, Alain; Mollard, L.; Baier, N.; Gravrand, O.; Destéfanis, G.

doi:10.1117/12.921868

Cited by 16 publications

(6 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In this paragraph, these benefits are shown on both the improved N/P Scorpio MW and P/N Scorpio LW technologies, respectively presented in 2014 [4] and [5]- [9]. In those papers, recent manufacturing improvements in HgCdTe MW and LW detectors were detailed.…”

Section: High Reliability Detectors Assesmentmentioning

confidence: 98%

RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development

et al. 2015

View full text Add to dashboard Cite

This paper presents recent improvements introduced in production lines of Mid-Wavelength Infra-Red (MWIR) and Long-Wavelength Infra-Red (LWIR) HgCdTe detectors that increase performances, image quality, and reliability. This was achieved thanks to accurate characterization of RMS noise distributions. Based on many MWIR and LWIR devices RMS distributions, a RMS noise distribution model that accounts for both Background Limited diodes and 1/f noise affected isolated diodes is first proposed. Then, a figure of merit for quantifying the defective pixels is introduced. This figure of merit is shown to be easy to use and robust to statistical variability. Moreover, it does also very well correlate with physics : there is high correlation between the total number of calculated defects and other figures of merit that gauge the material quality or the low frequency noise. The ability to accurately and efficiently quantify RMS noise benefits to Sofradir in its development of highly reliable and performant technologies. Such benefits are illustrated on the latest Sofradir MWIR and LWIR technologies that are demonstrated to be very robust regarding thermal stress and thermal cycling. Finally those technologies are shown to reach high image quality and stability.

show abstract

Section: High Reliability Detectors Assesmentmentioning

confidence: 98%

RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development

et al. 2015

View full text Add to dashboard Cite

show abstract

“…With the assumption of photo-response spectral characteristics of ideal photodiode for current responsivity S I,λ it follows an expression [7,8] S Il = h•q•l/h•c = h×q/hn = 0.806×h×l, A/W, (1) where q is the electron charge, h is the Planck constant, v and λ are the radiation frequency and wavelength, respectively. For MWIR ideal photodiode with λ co =λ max = 5 µm the maximum value of current responsivity with typical for HgCdTe photodiodes quantum efficiency h = 0.5 is …”

Section: Experiments and Estimationsmentioning

confidence: 99%

“…(see e.g. [1][2][3]). IR MWIR photodiodes (on the base of HgCdTe and InSb) are basically used at matrix arrays formation with pixel dimensions up to 15×15 µm and photodiodes number in the array up to 2048×2048 (for Refs.…”

Section: Introductionmentioning

confidence: 99%

HgCdTe PHOTODIODES FOR INFRARED MID-WAVELENGTH REGION

Sizov¹,

Цибрій²,

Вуйчик³

et al. 2016

SEMST

View full text Add to dashboard Cite

Abstract. HgCdTe photodiodes of relatively large area (Ø = 0.5 mm) for mid-wave infrared region (MWIR) were fabricated on the base of liquid phase epitaxial layers. Characteristics of these photodiodes were estimated to be applicable as those working in background limited performance (BLIP) mode. It was shown that in spectral range of atmospheric transparency λ = 3 to 5 µm obtained dynamical resistance of HgCdTe photodiodes allow to realize their detectivity D* that are restricted by fluctuations of background radiation with specific power of photon fluxes W eff ≈ 3.3·10 -4 -4.4·10 -5 W/cm 2 .

show abstract

“…This process leads to size, weight and power (SWAP) reduction. 6 Even more significant than system size reduction, is the potential reduction in optical complexity. For example, consider a large 5k × 5k array consisting of 5 μm detectors.…”

Section: Why Smaller Detectors?mentioning

confidence: 99%

“…The NEDT is discussed in Sec. 6. Section 7 provides practical aspects that suggest one wavelength band may be a better choice than the other.…”

Section: Introductionmentioning

confidence: 99%

Small detectors in infrared system design

Holst¹,

Driggers

2012

Opt. Eng

View full text Add to dashboard Cite

Abstract. Recent progress, in small infrared detector fabrication, has raised interest in determining the minimum useful detector size. We approach detector size analysis, from an imaging system point of view, with reasonable assumptions for future sensor design. The analysis is a simplified version of the target task performance model using the parameter F λ∕d for generalization. Our figure-of-merit is a system characteristic. The results are easy to use and yield minimum useful detector size of 2 μm for the mid-wave infrared region (MWIR) and 5 μm for the long-wave infrared region (LWIR) when coupled with an F ∕1 optical system under high signal-to-noise ratio conditions. Final size depends upon optical design difficulty, manufacturing constraints, noise equivalent differential temperature, and the operational scenario. For challenging signal-tonoise ratio conditions and more reasonable F ∕1.2 optics, a 3 μm MWIR detector and a 6 μm LWIR detector are recommended. There are many benefits to approaching these detector sizes with low F -number optics. They include lower cost detectors, no need for dual FOV or continuous zoom optics, and no need for dual F -number optics. Our approach provides the smallest volume and lowest weight sensor with maximum range performance. While this paper focuses on infrared design, our approach applies to all imaging sensors. © 2012 Society of Photo-Optical Instrumentation Engineers (SPIE).

show abstract

Status of MCT focal plane arrays in France

Cited by 16 publications

References 0 publications

RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development

RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development

HgCdTe PHOTODIODES FOR INFRARED MID-WAVELENGTH REGION

Small detectors in infrared system design

Contact Info

Product

Resources

About