Status report of the Dresden EBIS/EBIT developments

Zschornack, G.; Großmann, Frank; Kentsch, Ulrich; Ovsyannikov, V. P.; Ritter, Erik; Schmidt, M.; Thorn, Andrea; Ullmann, F.

doi:10.1063/1.3267846

Cited by 11 publications

(8 citation statements)

References 5 publications

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“…In addition, an Electron Beam Ion Source (EBIS) was also used for Au 55+ ions extracted at 2.0 kV. The gold ions were injected into the EBIS from an external liquid metal ion source [22,23]. The chemical etching of the ion-irradiated BaF 2 samples was done using HNO 3 (1% vol.)…”

Section: Methodsmentioning

confidence: 99%

Surface modifications of BaF2 and CaF2 single crystals by slow highly charged ions

El-Said

Heller

Wilhelm

et al. 2014

Applied Surface Science

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Ion-irradiation of solid surfaces is considered as one of the promising and powerful techniques for material nanostructuring. Recently, slow highly charged ions (HCI) have shown their potential in creating surface nanostructures in various solids. Here, we focus on the surface modifications of BaF 2 and CaF 2 single crystals by HCI. Despite the fact that both materials belong to alkaline-earth fluorides with the same crystalline structure, they exhibit different sensitivity for HCI-induced nanostructure. We discuss similarities and differences for the creation of HCI-induced nanohillocks and etch pits in both materials and their dependence on potential and kinetic energy deposition. Furthermore, we compare the results with modifications induced by swift heavy ions (SHI), in order to reach a better understanding of the mechanisms responsible for the creation of nanostructures in ionic fluoride single crystals.

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Section: Methodsmentioning

confidence: 99%

Surface modifications of BaF2 and CaF2 single crystals by slow highly charged ions

El-Said

Heller

Wilhelm

et al. 2014

Applied Surface Science

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“…A standard EBIT from the DREEBIT Co. (with data‐collecting software) was used to conduct the experiment. The search for resonance radiation is based on the TERX acquisition system that scans the electron energy . E e is determined by the accelerating potential between the cathode (electron source) and the electrode (anode) in the central part of the trap.…”

Section: Experiments Set Upmentioning

confidence: 99%

“…Ions are produced by electron‐induced impact ionization and then trapped in the axial direction by voltages applied to the drift tubes. It is possible to enhance concentration of the highest required ion charge states via evaporative cooling, by tuning the depth of the trapping voltage and by using the appropriately low gas pressure. Effects of the evaporative cooling were monitored with the Wien filter mounted just behind the trap working in the pulse mode with 200‐ms ionization time.…”

Section: Experiments Set Upmentioning

confidence: 99%

“…It is possible to enhance concentration of the highest required ion charge states via evaporative cooling, by tuning the depth of the trapping voltage and by using the appropriately low gas pressure. Effects of the evaporative cooling were monitored with the Wien filter mounted just behind the trap working in the pulse mode with 200‐ms ionization time. However, it is to assume that the observed EBIT plasma is still a mixture of at least a few different charged states.…”

Section: Experiments Set Upmentioning

confidence: 99%

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Enhanced Ar‐K X‐ray emission observed in EBIT at electron energies around 6,500 eV

et al. 2019

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Recently (2015) at the Institute of Physics of the Jagiellonian University, a commercial electron beam ion source (Dresden EBIT, DREEBIT Co.) was installed for teaching and scientific purposes. The first experiments were focused on observation of radiative recombination and dielectronic recombination (DR). A good resolution of the X‐ray spectra for DR in argon encouraged a more detailed search. An investigation of higher order resonances, namely, trielectronic recombination (TR: KK‐LLL, KK‐LLM,…) in argon ions, was initiated. The present experiment was conducted while scanning the electron beam energy of the EBIT over the region 5,700–7200 eV. This electron energy region was expected to manifest an enhancement of the Ar‐K X‐ray emission due to TR processes mentioned above. Indeed, a maximum‐like behavior of the radiation intensity was observed.

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“…Highly charged ions of xenon are produced with a roomtemperature Dresden-EBIT ion source [18]. With a typical kinetic energy of 7 keV=q, they are ejected as 1-μs long bunches from the electron beam ion trap (EBIT) and sent through a 90-degree sector dipole magnet, see Fig.…”

mentioning

confidence: 99%

Mass-Difference Measurements on Heavy Nuclides with an eV/c2 Accuracy in the PENTATRAP Spectrometer

et al. 2020

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First ever measurements of the ratios of free cyclotron frequencies of heavy, highly charged ions with Z > 50 with relative uncertainties close to 10 −11 are presented. Such accurate measurements have become realistic due to the construction of the novel cryogenic multi-Penning-trap mass spectrometer PENTATRAP. Based on the measured frequency ratios, the mass differences of five pairs of stable xenon isotopes, ranging from 126 Xe to 134 Xe, have been determined. Moreover, the first direct measurement of an electron binding energy in a heavy highly charged ion, namely of the 37th atomic electron in xenon, with an uncertainty of a few eV is demonstrated. The obtained value agrees with the calculated one using two independent, different implementations of the multiconfiguration Dirac-Hartree-Fock method. PENTATRAP opens the door to future measurements of electron binding energies in highly charged heavy ions for more stringent tests of bound-state quantum electrodynamics in strong electromagnetic fields and for an investigation of the manifestation of light dark matter in isotopic chains of certain chemical elements.

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Status report of the Dresden EBIS/EBIT developments

Cited by 11 publications

References 5 publications

Surface modifications of BaF2 and CaF2 single crystals by slow highly charged ions

Surface modifications of BaF2 and CaF2 single crystals by slow highly charged ions

Enhanced Ar‐K X‐ray emission observed in EBIT at electron energies around 6,500 eV

Mass-Difference Measurements on Heavy Nuclides with an eV/c2 Accuracy in the PENTATRAP Spectrometer

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