Proceedings of the International Conference on Computer-Aided Design 2018
DOI: 10.1145/3240765.3240852
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Steep coverage-ascent directed test generation for shared-memory verification of multicore chips

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Cited by 4 publications
(4 citation statements)
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“…A microarchitecture supporting out-of-order execution was adopted for all cores. For test generation, we adopted a DTG technique [Andrade et al 2018], and employed different test sizes (1ki, 2ki, and 4ki memory operations). For each test size, the generator was executed 12 times exploiting distinct random seeds, leading to 12 test suites containing different programs.…”
Section: Methodology and Main Experimental Resultsmentioning
confidence: 99%
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“…A microarchitecture supporting out-of-order execution was adopted for all cores. For test generation, we adopted a DTG technique [Andrade et al 2018], and employed different test sizes (1ki, 2ki, and 4ki memory operations). For each test size, the generator was executed 12 times exploiting distinct random seeds, leading to 12 test suites containing different programs.…”
Section: Methodology and Main Experimental Resultsmentioning
confidence: 99%
“…The dissertation not only proposed a novel approach as its main scientific contribution [Graf et al 2019], but it also provided innovative technical contributions to test generation leading to high coverage with small effort [Andrade et al 2018, Andrade et al 2020a, Andrade et al 2020b]. Finally, the required implementation effort contributed to the building of a verification framework that is effective to discover errors and can support different architectures and distinct microarchitecture variants.…”
Section: Discussionmentioning
confidence: 99%
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“…In this paper, we focus on debugging the multicore systems which is popular nowadays and propose an automatic debugging tool that leverages the synchronization points to help locating the error-triggered instructions. The current works about multicore systems concentrate on accelerating verification by improving the technique of random test generation [2], [4], [5], [7] and verifying cache coherency [2], [3], [4]. Also, some works are related to the verification of timings [6] and speed debugging the DUT [8].…”
Section: Introductionmentioning
confidence: 99%