2009
DOI: 10.1016/j.mee.2008.12.094
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Step and flash imprint lithography for quantum dots based room temperature single electron transistor fabrication

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Cited by 13 publications
(7 citation statements)
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“…Beyond ±0.5 V SD , there are fractional nA source-drain current changes in response to illumination. This device was fabricated early in the research project and is very similar to those previously reported [25,26]. The device used in the results shown in Figure 7 was fabricated much later and is similar to those reported [27].…”
Section: Set-br Integration Resultssupporting
confidence: 60%
“…Beyond ±0.5 V SD , there are fractional nA source-drain current changes in response to illumination. This device was fabricated early in the research project and is very similar to those previously reported [25,26]. The device used in the results shown in Figure 7 was fabricated much later and is similar to those reported [27].…”
Section: Set-br Integration Resultssupporting
confidence: 60%
“…NIL has also been successfully applied in the fabrications of organic nanoelectronics [96][97][98][99][100][101], photovoltaic devices with Si nanowires [102], single-electron memory device [103], organic [97] and inorganic nonvolatile memory [104], single-electron transistors [105,106] and poly-Si TFTs [107], etc. According to the physical characteristics of nanoimprint, this technique should find particular prospects for flexible nanoelectronics in which highly conductive polymers are demanded to be developed as the main materials for the devices and circuits.…”
Section: Nil For T-shape Gates and Hemtsmentioning
confidence: 99%
“…4 Specifically, competitive nets, like winner-take-all (WTA), provide easiness of operation due to their non-supervised training. 5 Although single-electron devices operating at room temperature have already been built, [6][7][8][9] it is still a challenge to propose, simulate and build more complex single-electron circuits operating properly at 300 K. 10,11 For example, a SET-WTA circuit has already been proposed. [12][13][14] This circuit was simulated for static inputs and was robust against effects such as offset charges.…”
Section: Introductionmentioning
confidence: 99%