Stereometric characterization of kefir microbial films associated with Maytenus rigida extract

et al. 2021

Journal of Microscopy

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In this paper, we introduced an advanced discussion of the 3D morphology of TiO2 coatings deposited on ITO substrate by electrodeposition under different deposition times. Atomic force microscopy was applied for obtaining topographic images of the samples. The images were processed using the MountainsMap 8.0 commercial software according to ISO 25178‐2:2012. Moreover, fractal theory was applied to study the surface microtexture of coatings. The morphology was affected by the deposition time, where the grain size decreased with the increase of the time, making film's surfaces smoother. In addition, the surface roughness exhibited a random behaviour, but does not presented significant difference between samples. The fractal dimension showed similar values for all coatings. In contrast, surface texture isotropy also exhibited random behaviour. However, advanced fractal parameters revealed that when the deposition time increased, the coatings microtexture has become uniform and less porous. Furthermore, all coatings presented high topographic uniformity, regardless of deposition time. These results revealed that the morphology and microtexture of TiO2‐based coatings can be controlled by the deposition time. Lay Description An advanced characterization on the micromorphology of 3D morphology, using AFM images, of Titanium dioxide (TiO2) coatings deposited on ITO substrate by electrodeposition under different deposition times. TiO2 is one of the most studied semiconductors to make photovoltaic devices. The versatility of this semiconductor is associated with low toxicity, high photochemical stability, abundance, and the facility to obtain by conventional synthesis routes. The obtention of a homogeneous and stable layer in the semiconductor TiO2 film deposition is a crucial stage in the assembly of sensitized photovoltaic devices. Atomic Force Microscopy (AFM) is a technique which can magnify up to a billion times and it uses a tip or probe which touches the sample surface point by point. The tip deflection is interpreted as the surface topography by the software, producing 2D or 3D images that generate several tribological parameters such as roughness in respect to a scanned area, has been a technique widely reported in the morphological characterization, determination of thickness, roughness, and particle size in thin films. Therefore, in this paper, the morphology was studied by atomic force microscopy using MountainsMap commercial software. The main goal was to study the influence of the deposition time on the morphology and microtexture of the material. New parameters such as surface entropy, fractal succolarity and fractal lacunarity were obtained for studying coatings microtexture's complexity.

Section: Resultsmentioning

confidence: 96%

“…All measurements were performed in air, at room temperature (296 ± 1 K) and 40% ± 1% relative humidity. The AFM images were analysed with MountainsMap Premium software trial version 8.4.8872, according to ISO 25178‐2:2012 40 , 41 …”

Section: Methodsmentioning

confidence: 99%

Nanoscale morphology and fractal analysis of TiO₂ coatings on ITO substrate by electrodeposition

Amâncio

Pinto

et al. 2021

Journal of Microscopy

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“…Several stereometric parameters were computed according to ISO 25178‐2:2012, where the physical concepts were based on the following references (Barcelay et al, 2020; Blateyron, 2013a, 2013b; Franco & Sinatora, 2015; Matos, Pinto, Ramos, Fonseca de Albuquerque, & Fonseca Filho, 2020). Further, to a complete assessment of the surface microtexture, we have used one‐dimensional PSD analysis, which was calculated according to Equation (1), described by Jacobs, Junge, and Pastewka (2017) using WsxM© 5.0 software (Horcas et al, 2007).…”

Section: Methodsmentioning

confidence: 99%

Stereometric characterization ofDinizia excelsaDucke wood from Amazon rainforest using atomic force microscopy

Conceição

Ţălu

Microscopy Res & Technique

et al. 2021

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Dinizia excelsa Ducke under three different cut conditions were carefully analyzed. The morphology and stereometry of different wood cutting surfaces (longitudinal radial, longitudinal tangential, and transversal) were studied by SEM and AFM. The results obtained in this study suggest that both the height parameters and the advanced stereometric parameters of the surfaces did not reveal a significant difference, indicating that the spatial patterns do not change according to the type of cut. In this way, the surface microtexture does not vary depending on the cut type. Similarly, the Hurst's coefficients did not show any significant difference in the spectrum of the PSD fractal region. On the other hand, Minkowski functionals presented a morphological difference between the samples. These results showed that the microtexture of the wood surface does not change as a function of the type of cut submitted to the same polishing process.

“…Random regions were chosen in the samples and the area evaluated was 1 Â 1 μm 2 (256 Â 256 pixels), with a scan rate of 0.7 s per line and a contact force of 19.2 nN. (Blateyron, 2013;Franco & Sinatora, 2015;Matos, Pinto, Ramos, Fonseca de Albuquerque, & Fonseca Filho, 2020).…”

Section: Afm Imaging and Morphologymentioning

confidence: 99%

Stereometric analysis of Ti₁₋_xAl_xN thin films deposited by direct current/radio frequency magnetron sputtering

Microscopy Res & Technique

Filho

Das

et al. 2021

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A study of image analysis of Ti 1Àx Al x N films deposited on corning glass substrates by a direct current (DC)/radio frequency (RF) magnetron sputtering system was performed. Atomic force microscopy (AFM) data were studied to understand how the impact of the concentration of Al content influences the 3D surface morphology as well as the surface texture parameters. The results showed that the superficial morphology was modified by the increase of Al content in the Ti 1Àx Al x N films, as well as the surface microtexture. It has also been observed that the Ti 1Àx Al x N film surface with the highest aluminum (Al) doping concentration presented a similar surface morphology to pristine titanium nitride (TiN) thin films. The Abbott-Firestone curves for all films exhibited an S-like shape suggesting topographic uniformity and Gaussian distribution of heights. An increase in surface uniformity is observed with Al concentration. The characterization of the surface morphology of Ti 1Àx Al x N films by the evaluation of surface statistical parameters suggests that the surface topography can be adjusted by suitable doping of aluminum and offers a deeper understanding of the applicability of these films.atomic force microscopy, stereometric analysis, surface morphology, Ti 1Àx Al x N thin films | INTRODUCTIONNitrides of transition metals are a suitable choice for minimizing wear in tools and dies and in automobile and aircraft components due to resistive properties at high temperatures and against sliding and abrasive wear and high hardness (Golosov et al., 2020;