2001
DOI: 10.1007/pl00010805
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STM and AFM characterization of thin metal oxide films electrodeposited from [P2Mo18O62]6−

Abstract: Two groups of techniques have been devised for the electrodeposition of new electroactive oxide ®lms from [P 2 Mo 18 O 62 ] 6) . In the ®rst group, two adsorption procedures were used: simple immersion of the electrode in a solution containing 10 )4 M [P 2 Mo 18 O 62 ] 6) in a pH 3.50 medium or cycling of the electrode in this solution in the potential domain of the ®rst three twoelectron waves of the heteropolyanion results in surfaces which retain the oxometalate by mere adsorption. Strikingly, during the cy… Show more

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Cited by 7 publications
(4 citation statements)
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“…As mentioned in the Experimental Section, the measurements were conducted after the solvent was evaporated, so that the effect of the solvent on friction forces could be excluded. It should be noted that the drying process may have an effect on the assembly structures owing to the potential shear flow and defects. , To avoid such an effect, the samples were characterized at the gas–solid interface by STM before friction measurements. Experimental results show that the structures of TMA and BTB networks are with no observable changes after the solvent evaporation.…”
Section: Resultsmentioning
confidence: 99%
“…As mentioned in the Experimental Section, the measurements were conducted after the solvent was evaporated, so that the effect of the solvent on friction forces could be excluded. It should be noted that the drying process may have an effect on the assembly structures owing to the potential shear flow and defects. , To avoid such an effect, the samples were characterized at the gas–solid interface by STM before friction measurements. Experimental results show that the structures of TMA and BTB networks are with no observable changes after the solvent evaporation.…”
Section: Resultsmentioning
confidence: 99%
“…To eliminate the solvent effect on the friction forces, the measurements were conducted at the gas–solid interface after the solvent was evaporated. However, due to the potential shear flow and defects, the solvent evaporation may have an impact on the assembly structures. , Before each measurement, the samples were characterized by STM to confirm the host–guest assembly structures in case of the impact of the drying process. The silicon CSG10 probe with a rectangular cantilever (nominal normal spring constant 0.1 N m –1 ) was used.…”
Section: Methodsmentioning
confidence: 99%
“…By contrast, organized arrays of individual POMs on graphite and metal surfaces have been investigated by scanning tunneling microscopy , (STM), atomic force microscopy (AFM), , and X-ray specular reflectivity .…”
mentioning
confidence: 99%