STM/SEM correlative study of facetted gold

Asenjo, A.; Gómez-Herrero, Júlio; Baró, A. M.

doi:10.1046/j.1365-2818.1997.2590823.x

Cited by 3 publications

(2 citation statements)

References 6 publications

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“…the diversification and deepening of research, some samples have shown novel characteristic changes under different test conditions (such as local stress on samples [3,4], multi-tip collaborative work [5][6][7], temperature change [8][9][10], magnetic field change [11][12][13][14], electrochemical regulation [15][16][17], etc), eliciting continuous interest. However, since the tunnel junction of STMs is often less than 1 nm [1], it tends to change drastically when adjusting the test environment of the sample, causing a collision of the sample and the tip, and then the test must be terminated.…”

Section: Introductionmentioning

confidence: 99%

A repeat positioning, scanning tunneling microscope based on a straight-push piezoelectric nanopositioner

Wenjing¹,

Wang²,

Xia³

et al. 2021

Meas. Sci. Technol.

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In this paper, we develop a repeat positioning, scanning tunneling microscope (STM), whose core component is a new straight-push piezoelectric nanopositioner. The special rigid frame structure and straight-push stepping method of this nanopositioner ensure that there is no lateral deviation while it is stepping. It has a smaller volume and a lower driving voltage than that of traditional piezoelectric nanopositioners with the same load capacity. The test results show that its threshold voltage is only 4 V. Additionally, when the driving signal frequency is constant, its step size and the amplitude of the driving signal show a linear relationship. Moreover, when the driving signal amplitude is constant, the velocity and driving signal frequency of the nanopositioner also show a linear relationship. In addition, the small STM (diameter less than 10 mm, length less than 50 mm) designed on the basis of this nanopositioner can work at full low-voltage. The STM’s high-resolution images and repeatable positioning performance are demonstrated in detail in this article. When the STM moves back and forth along the Z direction at a millimeter-scale distance, its positioning deviation in the same area of the sample is less than 30 nm. The capacity of the STM is very important for tracking and observing the different characteristics of some samples in different test conditions and is also significant for applications such as multi-tip collaborative work.

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Section: Introductionmentioning

confidence: 99%

A repeat positioning, scanning tunneling microscope based on a straight-push piezoelectric nanopositioner

Wenjing¹,

Wang²,

Xia³

et al. 2021

Meas. Sci. Technol.

View full text Add to dashboard Cite

show abstract

“…Two different approaches have been taken. Commercial SEM systems have been adapted to incorporate a STM stage [1][2][3][4][5][6][7][8][9][10] or STM systems have been retrofitted with a high resolution electron column to gain the additional benefit of SEM. [11][12][13][14][15][16][17][18][19] The latter systems operate mostly under true ultrahigh vacuum conditions (Ͻ1 ϫ10 Ϫ10 mbar) and are particularly suitable for a wide range of surface science investigations.…”

Section: Introductionmentioning

confidence: 99%

Combination of a Besocke-type scanning tunneling microscope with a scanning electron microscope

Emundts

Coenen

Pirug

et al. 2001

Review of Scientific Instruments

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Articles you may be interested inUltrahigh vacuum scanning electron microscope system combined with wide-movable scanning tunneling microscope Rev. Sci. Instrum. 76, 083709 (2005);The article describes the combination of a Besocke-type scanning tunneling microscope ͑STM͒ with a scanning electron microscope ͑SEM͒ in an ultrahigh vacuum ͑UHV͒ environment. The open design of the Besocke STM allows the SEM to be implemented as an add-on of a high resolution electron column and a secondary electron detector. The combined instrument is capable of atomic resolution imaging by STM and real time SEM imaging. SEM resolution down to about 80 nm was achieved. Simultaneous operation of STM and SEM is possible. The operation and performance of the combined instrument is illustrated by a variety of examples. Although the instrument is suitable for a wide range of applications where a combination of atomic resolution with lower magnification imaging is required, its operation in an UHV environment makes it particularly appropriate for the study of reactive metal surfaces.

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Analyses of small facets imaged with scanning-probe microscopy

Hegeman

Kooi

Groen

et al. 1999

Journal of Applied Physics

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Two tools for the analysis of facets as detected by scanning-probe microscopy ͑SPM͒ images are proposed. One tool is an adaptation of the radial-histogram transform proposed by D. Schleef et al. in Phys. Rev. B. 55, 2535. In this article the local slopes in the SPM image are in the present version determined by Savitsky-Golay filters with variable lengths ͓A. Savitsky and M. J. E. Golay, Anal. Chem. 36, 1627 ͑1964͔͒. These variable length filters turn out to be important to suppress the influence of noise obscuring the possibility to detect facets and to analyze corrugations with different length scales in SPM images, e.g., surface reconstructions. The other tool allows the direct quantitative determination of the orientation ͑with a standard deviation͒ of user-specified parts of facets. It makes use of a Savitsky-Golay filter as well. Both tools were applied to an artificially constructed SPM image and several experimental SFM images showing ͑ionic͒ MnO precipitates protruding out of a ͑metallic͒ Cu surface. It is shown that the Miller indices of the facets can be derived experimentally.

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STM/SEM correlative study of facetted gold

Cited by 3 publications

References 6 publications

A repeat positioning, scanning tunneling microscope based on a straight-push piezoelectric nanopositioner

A repeat positioning, scanning tunneling microscope based on a straight-push piezoelectric nanopositioner

Combination of a Besocke-type scanning tunneling microscope with a scanning electron microscope

Analyses of small facets imaged with scanning-probe microscopy

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