Storing Matter: a new analytical technique developed to improve the sensitivity and the quantification during SIMS analyses

Мансилла, C.; Wirtz, Tom

doi:10.1002/sia.3346

Cited by 10 publications

(8 citation statements)

References 15 publications

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“…In this study, using the storing matter technique, we investigate the extent of fragmentation of polystyrene (PS) molecular fragments deposited on a collector surface by sputter deposition as a function of surface coverage while keeping the primary ion fluence constant. The effect of polyatomic Bi 3 + primary ion instead of monatomic Ar + ion bombardment on the fragmentation during the ToF-SIMS analysis of the collector is also studied.…”

Section: Introductionmentioning

confidence: 99%

“…In order to avoid this matrix effect in SIMS, [1] the storing matter technique was developed. [2][3][4] It decouples the analysis step from the sputtering of the specimen: in the first step, the sputtered particles (neutrals and ionized atoms and molecules) are deposited on a collector material in the submonolayer range; the collector with deposit is transferred to the analytical instrument under ultrahigh vacuum conditions using a dedicated suitcase, [5] and in the second step, the deposit is analysed with dynamic or static SIMS. For inorganic samples, our studies show that the storing matter technique has a quantitative potential while keeping the high sensitivity of SIMS.…”

Section: Introductionmentioning

confidence: 99%

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Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Turgut

Wirtz²,

Belmahi

et al. 2014

Surface & Interface Analysis

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19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Jeju, SOUTH KOREA, SEP 29-OCT 04, 2013International audienceThe storing matter technique has been developed to get easier quantification in secondary ion mass spectrometry (SIMS) by decoupling the sputtering step from the analysis step. First, the matter is deposited in the submonolayer range on a collector that is analysed next by SIMS. Most work on the storing matter technique has been carried out for inorganic samples. The technique has also been applied successfully to organic samples. In this work, the fragmentation of polystyrene (PS) molecule deposited on silver (Ag) during storing matter deposition is investigated using static SIMS analysis with Bi-3(+) clusters. The fragmentation of PS at different coverages is studied by calculating the ratios of large-to-small peak intensities of fingerprint spectra. These ratios are compared with those obtained previously by the storing matter technique using Ar+ as analysis beam in time-of-flight-SIMS. Different degrees of fragmentation are observed with varying coverage, suggesting different sticking factors of fragments on the collector. Compared with Bi-3(+), the Ar+ projectile produces a higher amount of large fragments and is found to be better suited for the analysis of PS deposits on silver collectors. In both situations, C7H7+ is the major fragment in the mass spectra

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Turgut

Wirtz²,

Belmahi

et al. 2014

Surface & Interface Analysis

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“…In order to circumvent the matrix effect encountered in SIMS, the Storing Matter technique (StoMat) was developed to decouple the sputtering of the sample and the analysis of secondary ions. The principles of the technique are described elsewhere . At first, the technique has been shown to have a quantitative potential correcting the matrix effect .…”

Section: Introductionmentioning

confidence: 99%

“…The principles of the technique are described elsewhere. [10][11][12] At first, the technique has been shown to have a quantitative potential correcting the matrix effect. [13][14][15] Further studies proved that the matrix effect can be avoided when sputtering positive and negative ions from different matrices.…”

Section: Introductionmentioning

confidence: 99%

Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA

et al. 2016

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Quantitative analyses in secondary ion mass spectrometry (SIMS) become possible only if ionization processes are controlled. The Storing Matter technique has been developed to circumvent this so-called matrix effect, primarily for inorganic samples, but has also been extended to organic samples. For the latter, it has been applied to polystyrene in order to investigate the extent of damage in the polymer, its fragmentation during the sputter deposition process and the effect of the deposition process on the spectra taken by Time-of-Flight SIMS (ToF-SIMS). In this work, a multi-technique approach, which employs the Storing Matter technique for deposition and ToF-SIMS and X-ray photoelectron spectroscopy for characterization, is used to enhance the control of the deposition process, including the thickness of the deposit, the alteration of the source film and the influence of polymer composition on the Storing Matter process. Poly (methyl methacrylate) (PMMA) is used for this work. More detailed information about the sticking of polymer fragments on the metal collector is obtained by density functional theory calculations. This work allows for the conclusion that a part of the fragments deposited on the collector surface diffuses on the latter, reacts and recombines to form larger fragments. The behaviour observed for PMMA is similar to polystyrene, showing that oxygen has no major influence on the processes occurring during the sputter deposition process. Additionally, we have developed a new methodology using 2D ToF-SIMS images of the deposit to monitor the deposit thickness and to identify surface contaminations. The latter are not only located at the position of the deposit but all over the collector surface. Copyright © 2016 John Wiley & Sons, Ltd.

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“…To indicate the presence of the so‐called matrix effect, we use the SIMS useful yield U Y SIMS defined as the ratio of the number of detected ions and the number of sputtered atoms from the analysed sample. In order to circumvent the so‐called matrix effect, the storing matter technique proceeds in two steps. First, the sample is sputter‐deposited onto a well‐defined collector.…”

Section: Introductionmentioning

confidence: 99%

Si⁻ useful yields measured in Si, SiC, Si₃N₄ and SiO₂: comparison between the Storing Matter technique and SIMS

Kasel

Wirtz

2014

Surface & Interface Analysis

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The storing matter technique was developed to tackle quantification issues encountered in SIMS due to matrix effects. Here, we demonstrate the quantitative capabilities of the technique by comparing the useful yield for Si in different matrices exhibiting matrix effects in conventional SIMS analysis. Additionally, the effect of the collector material (Ag, Au, Cu and Ta) on the storing matter useful yield is investigated.

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Storing Matter: a new analytical technique developed to improve the sensitivity and the quantification during SIMS analyses

Abstract: Storing Matter is a new analytical technique for organic and inorganic materials

Cited by 10 publications

References 15 publications

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA

Si⁻ useful yields measured in Si, SiC, Si₃N₄ and SiO₂: comparison between the Storing Matter technique and SIMS

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Storing Matter: a new analytical technique developed to improve the sensitivity and the quantification during SIMS analyses

Abstract: Storing Matter is a new analytical technique for organic and inorganic materials

Cited by 10 publications

References 15 publications

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA

Si− useful yields measured in Si, SiC, Si3N4 and SiO2: comparison between the Storing Matter technique and SIMS

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Si⁻ useful yields measured in Si, SiC, Si₃N₄ and SiO₂: comparison between the Storing Matter technique and SIMS