High-performance semiconductor devices
require ohmic contact (OhC)
with low contact resistance, which are widely associated with weak
Fermi level pinning (FLP) effects. However, the FLP effect does not
play a completely negative role in the metal/semiconductor contact.
Especially for functionalized MXenes, it is necessary to systematically
study whether the FLP effect occurs at the interface of different
functional groups and the influence of the FLP effect on MXene/semiconductor
interfaces. In this article, we select functionalized MXenes (M
n+1X
n
T2, M = Ti–Ta; n = 1 and 2; X = C and N; T
= F, O, and OH) as electrode materials for the MoSi2N4 monolayer and investigate their interfacial properties by
using first-principles calculations. Our results indicate that OH-MXenes
are promising electrode materials for the MoSi2N4 monolayer. In OH-MXene/MoSi2N4 van der Waals
heterostructures (VHTs), the strong FLP effect fixes the Fermi level
in conduction bands, resulting in the ohmic contact. A small van der
Waals (vdW) gap brings low tunneling barriers and contact resistances,
which improve the electron injection efficiency. However, F-MXenes
will bring a controllable Schottky contact (ShC) and O groups form
Ohmic contact (OhC) or quasi-OhC with a strong FLP effect and high
contact resistance, when contacting the MoSi2N4 monolayer. Therefore, it is suggested to avoid the presence of O
functional groups in the experiment. Our work first correlates the
interface properties of MXenes/semiconductors with the FLP effect
and provides a useful insight, which will provide a theoretical guidance
on how to select the dominant functional group experimentally and
find efficient two-dimensional (2D) semiconductor devices.