1993
DOI: 10.1103/physrevb.47.13730
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Strain relaxation in ultrathin films: A modified theory of misfit-dislocation energetics

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Cited by 28 publications
(15 citation statements)
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“…Here, we use our high‐fidelity BOP approach to derive the misfit strain energy density and dislocation line energy as functions of island dimensions and lattice mismatch assuming that these islands are independent. These functions are then used to accurately calculate the dislocation density in nano‐patterned multilayers according to classic misfit dislocation theory .…”
Section: Theoretical Prediction Of Defect‐free Cdte/cds Solar Cellsmentioning
confidence: 99%
“…Here, we use our high‐fidelity BOP approach to derive the misfit strain energy density and dislocation line energy as functions of island dimensions and lattice mismatch assuming that these islands are independent. These functions are then used to accurately calculate the dislocation density in nano‐patterned multilayers according to classic misfit dislocation theory .…”
Section: Theoretical Prediction Of Defect‐free Cdte/cds Solar Cellsmentioning
confidence: 99%
“…Moreover, as the relaxation increases with the wetting layer thickness, the dislocation density near the interface between the NR and the wetting layer increases (Figs 5e and 5h), which can be due to a complete strain relaxation. 49 However, this density decreases in (Figs 5f and 5i) and above the interface (Figs 5g and 5j). Remarkably, Figs 5f and 5i indicate a rapid reduction in the dislocation density in the interface (see the area circled with yellow in Fig.…”
Section: Growth Mechanismmentioning
confidence: 99%
“…A rather large number of experimental and theoretical studies have been devoted to the transition from a coherent interface to an incoherent one, 1,2,3 driven by the elastic energy stored in the layer. In the case of nanometric films, the mechanisms at work still raise fundamental questions 4 since the film thickness is comparable to the dislocation core radius. Many fewer studies 5 focus on the chemical gradients that may exist close to interfaces.…”
Section: Introductionmentioning
confidence: 99%