Stress induced anisotropy effect for SAL films in magnetoresistive elements

Ishi, Tsutomu; Suzuki, T.; Ishiwata, N.; Yamada, Kazuhiko

doi:10.1109/20.538633

Cited by 6 publications

(2 citation statements)

References 6 publications

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“…5 the AC bias current sweep, the transfer curve response appears 'stiffer' than the measured head output, i.e., lower in amplitude and less symmetry variation across the sweep. A possible origin is the effective stress distribution in the contact/sensor stack system arising due to the sensor fabrication process, and the change in local stresses as the sensor heats up in operation [10]. This effect was not captured in the simulation process.…”

Section: B Modeling Resultsmentioning

confidence: 98%

Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads

2000

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The dependence of CoPt stabilization properties on surface topography and seedlayer thickness has been investigated. The Coercivity degrades drastically without a Cr seed, showing a dependence upon surface angle. Using the resulting data wafer level sensor structures are micromagnetic simulated. Poor seedlayer coverage on the junction edge yields open transfer curve loops and degraded sensor response.

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Section: B Modeling Resultsmentioning

confidence: 98%

Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads

2000

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“…C HANGES observed in the transfer curves of spin-valve sensors during sensor processing can be assigned to different effects, namely chemical attack (corrosion), stress [1], [2], and high temperature. In this paper the effect of high temperature on sensor transfer curves is analyzed.…”

Section: Introductionmentioning

confidence: 99%

Annealing effect on spin-valve sensor transfer curves

et al. 1998

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Unshielded spin-valve sensors were fabricated and annealed to study the effect of high temperature processing on the transfer curves. A micromagnetic simulation program was developed to analyze the changes observed on the transfer curves upon annealing. Analysis of experimental data versus the micromagnetic simulations indicates two causes responsible for the progressive loss of the MR signal upon annealing above the blocking temperature: a rotation of the pinned layer magnetization from the transverse to the longitudinal direction (along the sensor trackwidth) and an increase of the free layer anisotropy. Rotation of the free layer easy axis can also be observed. Cool down in a magnetic field can prevent this MR loss by pinning the magnetization direction during the high temperature stage.Index Terms-Magnetic recording/reading heads, magnetoresistive materials and devices, micromagnetic simulations, spinvalve sensors, thermal stability.

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Giant magneto-impedance effect in amorphous magnetostrictive FeSiB thin films

Zhou

Cai

et al. 2000

Journal of Magnetism and Magnetic Materials

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Stress induced anisotropy effect for SAL films in magnetoresistive elements

Cited by 6 publications

References 6 publications

Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads

Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads

Annealing effect on spin-valve sensor transfer curves

Giant magneto-impedance effect in amorphous magnetostrictive FeSiB thin films

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