Stress intensity factors analysis for crack around film cooling holes in Ni-based single crystal with contour integral method

Abstract

PurposeThis paper aims to provide SIF calculation method for engineering application.Design/methodology/approachIn this paper, the stress intensity factors (SIFs) calculation method is applied to the anisotropic Ni-based single crystal film cooling holes (FCHs) structure.FindingsBased on contour integral, the anisotropic SIFs analysis finite element method (FEM) in Ni-based single crystal is proposed. The applicability and mesh independence of the method is assessed by comparing the calculated SIFs using mode of plate with an edge crack. Anisotropic SIFs can be calculated with excellent accuracy using the finite element contour integral approach. Then, the effect of crystal orientation and FCHs interference on the anisotropic SIFs is clarified. The SIFs of FCH edge crack in the [011] orientated Ni-based single crystal increases faster than the other two orientations. And the SIF of horizontal interference FCHs edge crack is also larger than that of the inclined interference one.Originality/valueThe SIFs of the FCH edge crack in the turbine air-cooled blade are innovatively computed using the sub-model method. Both the Mode I and II SIFs of FCHs edge crack in blade increase with crack growing.