At present Ge as high-mobility material is considered as possible replacement of Si in microelectronics. The main obstacle on this way is the large vacancy concentration obtained after the implantation of shallow donors. This prevents the formation of n+ regions and has a negative impact on device performance. One of the ways to eliminate the detrimental effect of such defects is the codoping approach. In this study the behaviour of Na impurity in germanium together with formation of defect complexes with vacancies, divacancies and shallow donors (P and As) were investigated using hybrid DFT calculations. The site preference, diffusion barriers, charge states, binding energies of various complexes as well as activation of donor-vacancy complexes with both F and Na codoping were investigated. For this purpose two extreme cases were considered. Firstly, we calculate concentrations of substitutional and interstitial Na together with monovacancies in the case of quasiequilibrium conditions realized for doping from melt. Another extreme case is Na codoping during ion implantation. Our calculations show that Na passivates vacancies, divacancies and donor-vacancy complexes (E-centers) with the large energy gain which prevents the rapid donor diffusion similar to the case of doping with fluorine. We shown that passivation of E-centers with both F and Na impurities leads to the back transformation of such complexes into the shallow donors. This means that codoping with Na may neutralize the harmful effect of vacancies and is perspective for defect engineering.