2008
DOI: 10.3938/jkps.53.1685
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Strong Luminescence and Easy Color Control for SiOx Thin Films by Using RF Magnetron Sputtering

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“…The charge transfer mechanism between O and Si occurs only in the blue region [26] and therefore also cannot account for the new peaks. Even emission from nanocrystalline silicon [27] has been considered, but since the XPS in our previous work [14] does not show a peak related to pure Si this is ruled out. What remains is emission due to defects, suggesting that the presence of Ag creates new optically active defects in the SiO 2 network which may be responsible for these new peaks.…”
Section: Methodsmentioning
confidence: 95%
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“…The charge transfer mechanism between O and Si occurs only in the blue region [26] and therefore also cannot account for the new peaks. Even emission from nanocrystalline silicon [27] has been considered, but since the XPS in our previous work [14] does not show a peak related to pure Si this is ruled out. What remains is emission due to defects, suggesting that the presence of Ag creates new optically active defects in the SiO 2 network which may be responsible for these new peaks.…”
Section: Methodsmentioning
confidence: 95%
“…What remains is emission due to defects, suggesting that the presence of Ag creates new optically active defects in the SiO 2 network which may be responsible for these new peaks. PL emission close to 380 nm has been attributed to surface defects formed after exposure to an abundant oxygen environment [27]. In our case, the silver ions (in Ag 2 O) convert to metallic Ag (in the form of NPs) at high temperature and during this process oxygen is released, suggesting an abundant oxygen environment suitable for the formation of these defects.…”
Section: Methodsmentioning
confidence: 96%