2018
DOI: 10.1007/s12274-018-1970-7
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Strong room-temperature emission from defect states in CVD-grown WSe2 nanosheets

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Cited by 28 publications
(26 citation statements)
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“…The highly crystalline structure (Fig. 4b), as well as the narrow E 1 2g Raman peak (a FWHM of 5.7 cm −1 ) and the sharp PL emission (a FWHM of 49 meV) without the defect emission at 1.54 eV 7,8,25,44 , indicate high quality of the CVD-WSe 2 samples grown on the ne-PECVD 2D-BN.
Fig. 4Direct growth of CVD-WSe 2 on two-dimensional hexagonal-boron nitride (2D-BN).
…”
Section: Resultsmentioning
confidence: 96%
“…The highly crystalline structure (Fig. 4b), as well as the narrow E 1 2g Raman peak (a FWHM of 5.7 cm −1 ) and the sharp PL emission (a FWHM of 49 meV) without the defect emission at 1.54 eV 7,8,25,44 , indicate high quality of the CVD-WSe 2 samples grown on the ne-PECVD 2D-BN.
Fig. 4Direct growth of CVD-WSe 2 on two-dimensional hexagonal-boron nitride (2D-BN).
…”
Section: Resultsmentioning
confidence: 96%
“…This emission difference cannot be observed by optical or AFM measurements. PL emission in monolayer TMDCs crystal is usually nonuniform and has been observed quite a few times in both CVD-grown [2123, 5153] and mechanically exfoliated layers [24, 5456]. The main causes of nonuniform PL emission include lattice defects (including impurities [56, 57] and vacancies [27]), localized electronic states [52, 58], strain [43], and edge effect [22].…”
Section: Resultsmentioning
confidence: 99%
“…3. The obtained PL spectra from center position is deconvoluted into three peaks: neutral exciton at ~ 1.624 eV (marked as A) [51, 52], trion at 1.60 eV (marked as A + ) [29, 52], and an unknown emission peak (marked as D) around 1.53 eV (the detailed fitting basis are shown in Additional file 1: Figures S6–S8). Figure 3b shows the PL emission is dominated by the A + in the center position.…”
Section: Resultsmentioning
confidence: 99%
“…Wu et al studied the effects of defects on the device transmission performance in monolayer WSe 2 tunneling field-effect transistors (TFSTs) by performing the ab initio calculation, which indicates that defects can be well designed to obtain high-performance TFETs [25]. Meanwhile, structural defects were found in the as-grown 2D materials due to the imperfection of the growth process [19, 20, 2628]. For example, intrinsic structural defects, such as point defects, are noticeable in the as-grown monolayer WSe 2 [26].…”
Section: Introductionmentioning
confidence: 99%
“…Meanwhile, structural defects were found in the as-grown 2D materials due to the imperfection of the growth process [19, 20, 2628]. For example, intrinsic structural defects, such as point defects, are noticeable in the as-grown monolayer WSe 2 [26].…”
Section: Introductionmentioning
confidence: 99%