2017
DOI: 10.1073/pnas.1621495114
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Strong signal increase in STED fluorescence microscopy by imaging regions of subdiffraction extent

Abstract: Photobleaching remains a limiting factor in superresolution fluorescence microscopy. This is particularly true for stimulated emission depletion (STED) and reversible saturable/switchable optical fluorescence transitions (RESOLFT) microscopy, where adjacent fluorescent molecules are distinguished by sequentially turning them off (or on) using a pattern of light formed as a doughnut or a standing wave. In sample regions where the pattern intensity reaches or exceeds a certain threshold, the molecules are essent… Show more

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Cited by 100 publications
(98 citation statements)
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“…The 2D and 3D DyMIN STED fluorescence nanoscopy was demonstrated with a microscope setup extended from the one previously described in ref. 11. For sample preparation of rat hippocampal neurons (Fig.…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations
“…The 2D and 3D DyMIN STED fluorescence nanoscopy was demonstrated with a microscope setup extended from the one previously described in ref. 11. For sample preparation of rat hippocampal neurons (Fig.…”
Section: Methodsmentioning
confidence: 99%
“…It enables the recording of many more frames of the respective sample region and/or imaging at higher resolutions, since a higher STED intensity can be applied, albeit at the expense that neighboring areas are potentially negatively affected (11).…”
Section: Significancementioning
confidence: 99%
See 2 more Smart Citations
“…To simplify the system, only one SLM was adopted to modulate the same beam twice, so as to produce 3D depletion on the basis of the particular polarization‐response characteristic of SLM . To further improve the 3D resolution of STED, which is mainly limited by photobleaching and photodamage, the focal intensity distributions were adaptively controlled by the SLM to reduce the overall illumination dose and achieve ≈60‐nm axial resolution . Axial depletion can also be used for other similar point scanning techniques, such as fluorescence emission difference microscopy, to increase their resolution …”
Section: Methods For Axial Srfmmentioning
confidence: 99%