“…X-ray magnetic diffraction at high pressure has become accessible over the past 15 years, with examples of both nonresonant and resonant diffraction. These include studies of antiferromagnetic Cr (Feng et al, 2007(Feng et al, , 2015a, CeFe 2 (Wang et al, 2012), GdSi (Feng et al, 2014), MnP (Wang et al, 2016), CeFe 2 at the Ce L 3 edge (E = 5.720 keV) (Kernavanois et al, 2005;Braithwaite et al, 2006;Paolasini et al, 2007), -Li 2 IrO 3 (albeit without polarization analysis by Breznay et al, 2017) and Sm 2 Ir 2 O 7 (Wang et al, 2019) at the Ir L 3 edge (E = 11.214 keV) and Cd 2 Os 2 O 7 at the Os L 2 edge (E = 12.387 keV) (Wang et al, 2018). Recently, we have extended these techniques to samples pressurized to 40 GPa and beyond at temperatures down to $3.5 K. With fourthgeneration synchrotron radiation sources on the horizon offering enhanced brilliance and total flux (Hettel, 2014), we hope that a detailed description of the techniques of highpressure X-ray magnetic diffraction will promote broader interest and understanding in the community.…”