A common limitation of experiments using color centers in diamond is the poor photon collection efficiency of microscope objectives due to refraction at the diamond interface. We present a simple and effective technique to detect a large fraction of photons emitted by color centers within a planar diamond sample by detecting light that is guided to the edges of the diamond via total internal reflection. We describe a prototype device using this "side-collection" technique, which provides photon collection efficiency ≈ 47% and photon detection efficiency ≈ 39%. We apply the enhanced signal-to-noise ratio gained from side-collection to AC magnetometry using ensembles of nitrogen-vacancy (NV) color centers, and demonstrate AC magnetic field sensitivity ≈ 100 pT/ √ Hz, limited by added noise in the prototype side-collection device. Technical optimization should allow significant further improvements in photon collection and detection efficiency as well as sub-picotesla NV-diamond magnetic field sensitivity using the side-collection technique.