2000
DOI: 10.1103/physrevb.61.2246
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Structural analysis of Fe/Ni(001) films by photoelectron diffraction

Abstract: The structure of Fe films, epitaxially grown on Ni͑001͒, has been studied in the 0-14 ML coverage range by means of photoelectron diffraction ͑PD͒ in the forward scattering regime. Quantitative analysis by a multiple scattering approach has been performed on Fe films at a coverage of 3 and 7 ML. Analysis of the 3-ML data showed that growth was not layer-by-layer but rather occurred through islands nucleation and that transition from the pseudomorphic fcc to the bcc phase was located in this early stage of grow… Show more

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Cited by 31 publications
(13 citation statements)
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“…However, the experimental point 30 is distinctly in the AFMD region, and our theoretical prediction lies again within the experimental limits. In reality, however, magnetic polarization due to FM Ni substrate may induce FM order in the film.…”
mentioning
confidence: 80%
“…However, the experimental point 30 is distinctly in the AFMD region, and our theoretical prediction lies again within the experimental limits. In reality, however, magnetic polarization due to FM Ni substrate may induce FM order in the film.…”
mentioning
confidence: 80%
“…At the same time, a match between the fcc lattices (a Ni = 0.352 nm) requires a compression as small as 2%. The formation of a pseudomorphous fcc Fe phase on (001) Ni and the subsequent transition to the bcc structure were also observed in later studies [43,44]. At a small mismatch between dissimilar lattices, e.g., in the Fe/Au(001) and Fe/Ir(001) systems [45], the body-centered pseudomorphous phase persists.…”
Section: Single-phase Nanostructuresmentioning
confidence: 73%
“…Finally, at doses above 1 Â 10 17 ions/cm 2 , the milling process results in the usual trench-like profiles, with the rim remaining as a fingerprint of the swelling effect, similar to what is reported in Refs. [9,16]. We notice that for a dose of 1 Â 10 17 ions/cm 2 an erosion depth corresponding to the film thickness is reached, therefore the morphology observed at the highest dose belongs to the SrTiO 3 substrate.…”
Section: Resultsmentioning
confidence: 92%
“…FIB patterning was performed in a dual beam system (FEI DB235M ) described elsewhere [9], with a Ga ion beam of 30 keV energy, 10 pA current (corresponding to 10 nm spotsize), 10 ms pixel dwell time, and normal incidence angle. Ion doses ranged from 5 Â 10 12 to 3 Â 10 17 ions/cm 2 .…”
Section: Methodsmentioning
confidence: 99%
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