Abstract:Structural, magnetotransport, and micromagnetic properties of sputtered Ir(111)/Co superlatticesThe structure and composition of a Co/ Re trilayer and a 19-period superlattice were characterized by high-resolution transmission electron microscopy ͑TEM͒ and scanning TEM ͑STEM͒. Low-angle x-ray reflectivity measurements were performed and compared with the TEM results. The Re and Co layers are epitaxial with their ͑1010͒ planes parallel to the ͑1120͒ plane of Al 2 O 3 , and the ͓001͔ direction of Re and Co layer… Show more
“…The calculation used is based on path-length calculations of interference in thin films. [50][51][52][53] A similar value (81 AE 2 nm) for the thickness was obtained from the Fast Fourier Transform (FFT) of the data. 54 The data were fit using the segmented fit algorithm.…”
Section: Structural Characterisation Of Inter-grown and Pure N ¼ 6 Filmsmentioning
“…The calculation used is based on path-length calculations of interference in thin films. [50][51][52][53] A similar value (81 AE 2 nm) for the thickness was obtained from the Fast Fourier Transform (FFT) of the data. 54 The data were fit using the segmented fit algorithm.…”
Section: Structural Characterisation Of Inter-grown and Pure N ¼ 6 Filmsmentioning
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