Structural and electrical evaluation of KNN ceramic

A solution‐processed piezoceramic thin‐film MπM parallel‐plate capacitor structure to determine electromechanical coefficient using capacitance–voltage measurements is demonstrated. Electrical loading is applied to the capacitor to stimulate out‐of‐plane longitudinal and transverse elongation. The piezoelectric coefficient (d 33) is estimated using the spatial deviation of thin‐film dimensions as a function of the applied electric field. The results are validated using finite element method‐based modeling and compared with several measurements in literature, including piezoresponse force microscopy‐based measurements, which are generally considered unreliable due to strong electrostatic interactions between the tip‐cantilever, and the charged sample surface, wherein such artifacts result in the overestimation of the electromechanical response of the material under investigation.

show abstract

Extraction of Electromechanical Coefficients from Capacitance–Voltage Measurements of Unannealed Solution‐Processed KNN Thin Films: Effects of Frequency and Electrostatic and Mechanical Deformation

Singh

Deol

Kritika

et al. 2022

Physica Status Solidi (a)

View full text Add to dashboard Cite

show abstract

Piezoelectric enhancements in K0.5Na0.5NbO3-based ceramics via structural evolutions

Izzuddin

Jumal

Zainuddin

et al. 2019

Ceramics International

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Structural and electrical evaluation of KNN ceramic

Cited by 2 publications

References 7 publications

Extraction of Electromechanical Coefficients from Capacitance–Voltage Measurements of Unannealed Solution‐Processed KNN Thin Films: Effects of Frequency and Electrostatic and Mechanical Deformation

Extraction of Electromechanical Coefficients from Capacitance–Voltage Measurements of Unannealed Solution‐Processed KNN Thin Films: Effects of Frequency and Electrostatic and Mechanical Deformation

Piezoelectric enhancements in K0.5Na0.5NbO3-based ceramics via structural evolutions

Contact Info

Product

Resources

About