2005
DOI: 10.1016/j.jcrysgro.2004.12.019
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Structural and luminescent properties of ZnO epitaxial film grown on Si(111) substrate by atmospheric-pressure MOCVD

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Cited by 29 publications
(20 citation statements)
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“…As an important member of the wide bandgap semiconductor family, ZnO has attracted much attention from researchers due to its excellent optical and electrical properties. ZnO is a group II-VI direct bandgap semiconductor material with a bandgap width of 3.37eV at room temperature and a hexagonal wurtzite structure with lattice constants a=0.325nm and c=0.52nm [3,4]. As a new functional material, ZnO has strong ability of resisting high energy proton bombardment and thermal stability, is not easily oxidized in the atmosphere, has high cohesive energy and melting point, strong binding ability, exciton binding energy up to 60meV , much larger than the room temperature thermal ionization energy (26meV), indicating that ZnO excitons have good stability.…”
Section: Introductionmentioning
confidence: 99%
“…As an important member of the wide bandgap semiconductor family, ZnO has attracted much attention from researchers due to its excellent optical and electrical properties. ZnO is a group II-VI direct bandgap semiconductor material with a bandgap width of 3.37eV at room temperature and a hexagonal wurtzite structure with lattice constants a=0.325nm and c=0.52nm [3,4]. As a new functional material, ZnO has strong ability of resisting high energy proton bombardment and thermal stability, is not easily oxidized in the atmosphere, has high cohesive energy and melting point, strong binding ability, exciton binding energy up to 60meV , much larger than the room temperature thermal ionization energy (26meV), indicating that ZnO excitons have good stability.…”
Section: Introductionmentioning
confidence: 99%
“…Lattice period of silicon and sapphire have large misfits with lattice period of hexagonal ZnO (≈ 41% and ≈ 18%, respectively) [4]. Moreover, Si undergoes oxidation in argon-oxygen ambient at ZnO growth and therefore formation of amorphous SiO x layer occurs [5]. This layer causes deterioration of the crystal quality of growing ZnO layer.…”
Section: Introductionmentioning
confidence: 99%
“…The visible emission comes from the defect level of the ZnO films [5][6][7][8] . The samples exhibit the n-type conduction in the hot-probe measurement, and the oxygen vacancy (V O ) is the main defect for the n-type ZnO films [15] .…”
Section: Analysis Of the Pl Spectramentioning
confidence: 99%
“…The emission peaks of ZnO films mainly contain an excition peak (∼380 nm) [2][3][4][5][6][7] and a green peak (∼510 nm) [6,7] . With the further study of the ZnO films photoluminescent (PL) properties, blue peaks at various wavelengths have been reported, e.g.…”
mentioning
confidence: 99%