2020
DOI: 10.1088/1674-1056/ab90e6
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Structural and optical characteristic features of RF sputtered CdS/ZnO thin films*

Abstract: In this study, CdS/ZnO (2:3 mol%) thin films are successfully deposited on quartz substrates by using the sputtering technique. Good images on the structural and optical characteristic features of CdS/ZnO thin films before and after annealing are obtained. The CdS/ZnO thin films are annealed respectively at temperatures of 373 K, 473 K, and 573 K and the structural features are examined by XRD, ATR-FTIR, and FESEM. The optical properties of CdS/ZnO thin films such as refractive indices, absorption coefficients… Show more

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Cited by 25 publications
(3 citation statements)
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“…5 (b) shows the average thickness of the thin lm (116 nm). The surface morphology results in this work are consistent with the previous studies [29,30]. Figure 6 shows the FESEM images of the AlGaN thin lms synthesized on samples 1 and 2 with their cross-section.…”
Section: Surface Morphologysupporting
confidence: 90%
“…5 (b) shows the average thickness of the thin lm (116 nm). The surface morphology results in this work are consistent with the previous studies [29,30]. Figure 6 shows the FESEM images of the AlGaN thin lms synthesized on samples 1 and 2 with their cross-section.…”
Section: Surface Morphologysupporting
confidence: 90%
“…Furthermore, the optical band gap (E g ) of the prepared CdS NPs was visually assessed via Tauc’s law, (αhυ) n = A(hυ − E g ), where α, A, n, and hυ are the absorbance, the directly proportional constant, type of transition (2 for transition with direct property), and the value of energy band gap, respectively [ 19 , 20 ], which show 3.2 eV in its direct transition energy band gap. Thus, from Figure 2 b, the CdS/Si electrode, surface defects on the electrode-electrolyte interface may capture photoelectrons because of defect energy levels that exist above the conduction band of CdS, leading to carrier recombination at the electrode–electrolyte junction and increased hydrogen generation performance when lighted [ 21 , 22 ]. Furthermore, from Figure 2 d, the extinction coefficient (k) and refractive index (n), which are important for optoelectronic applications, were also computed using the following formula: where α is the absorption coefficient, λ and R represent wavelength and optical reflectance, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…O CdS sem calcinação apresenta picos característicos do estiramento da ligação Cd-S em 650, 1.020 e 1.050 cm -1 , além das bandas características da água (KIANI et al, 2020;SABAH et al, 2010;SUSHA et al, 2018). Com a calcinação a 400°C, a amostra apresenta picos também relacionados à ligação Cd-S em 590, 720, 960, 1.050 e 1.109 cm -1 (AL- BARADI et al, 2020;GE et al, 2012;ZHOU et al, 2021), além das bandas típicas da água.…”
Section: Espectroscopia No Infravermelhounclassified