2017
DOI: 10.1016/j.ijleo.2017.08.042
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Structural and optical characterization of GaAs and InGaAs thin films deposited by RF magnetron sputtering

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Cited by 8 publications
(2 citation statements)
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“…The aim of these nanostructure preparation alternatives is to obtain good structural quality III-V semiconductors compatible with traditional semiconductor technology [13][14][15][16]. The success of these efforts will translate in the production of low-cost optical devices, compared with some widely used epitaxial techniques, such as molecular-beam epitaxy (MBE) [17][18][19][20][21][22][23].…”
Section: Centro De Investigación Ymentioning
confidence: 99%
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“…The aim of these nanostructure preparation alternatives is to obtain good structural quality III-V semiconductors compatible with traditional semiconductor technology [13][14][15][16]. The success of these efforts will translate in the production of low-cost optical devices, compared with some widely used epitaxial techniques, such as molecular-beam epitaxy (MBE) [17][18][19][20][21][22][23].…”
Section: Centro De Investigación Ymentioning
confidence: 99%
“…With this technique semiconductor layers can be deposited on monocrystalline, polycrystalline, and/or amorphous substrates. However, reports on the use of this technique for the growth of polycrystalline III-V semiconductors are scarce [30,31].…”
Section: Centro De Investigación Ymentioning
confidence: 99%