2009
DOI: 10.1016/j.jcrysgro.2009.07.015
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Structural and optical characterization of MOVPE grown InGaP/GaAs MQWs for advanced photovoltaic devices

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Cited by 7 publications
(2 citation statements)
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“…Such an estimated well width is only slightly larger than the nominal one (8 nm) and agrees, within the experimental uncertainty, with the results of a transmission electron microscopy investigation on similar samples. 27)…”
Section: Line-shape Analysismentioning
confidence: 99%
“…Such an estimated well width is only slightly larger than the nominal one (8 nm) and agrees, within the experimental uncertainty, with the results of a transmission electron microscopy investigation on similar samples. 27)…”
Section: Line-shape Analysismentioning
confidence: 99%
“…Lattice-matched In 0.485 Ga 0.515 P/GaAs hetero-structures are becoming major III-V semiconductor systems, because compared with AlGaAs/GaAs systems, they have lower reactivity with oxygen, higher number of reduced DX centers [1], and lower interfacial recombination rates [2]. InGaP/GaAs hetero-structures are thus attractive alternatives to AlGaAs/GaAs systems for applications in hetero-structure field-effect transistors (HFETs) [3,4], hetero-junction bipolar transistors (HBTs) [5,6], high power lasers [7][8][9], and solar energy conversion devices [10][11][12].…”
Section: Introductionmentioning
confidence: 99%