2014
DOI: 10.12785/jnam/020201
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Structural and Optical Properties of SnS Thin Films

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Cited by 39 publications
(11 citation statements)
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“…The favored location of the particle is due to the circumstance that the growing method is controlled by nucleation. The results are in agreement with the finding of reported researches [13][14][15]. The crystallite size was calculated from Scherer's equation [16] D = 0.9λ / β cosθ (1) where λ is the X-ray wavelength (Å) , β is the full width at half maximum intensity (FWHM) (radian), θ is Bragg's diffraction angle of the XRD peak (degree).…”
Section: Powder Xrd Analysissupporting
confidence: 88%
“…The favored location of the particle is due to the circumstance that the growing method is controlled by nucleation. The results are in agreement with the finding of reported researches [13][14][15]. The crystallite size was calculated from Scherer's equation [16] D = 0.9λ / β cosθ (1) where λ is the X-ray wavelength (Å) , β is the full width at half maximum intensity (FWHM) (radian), θ is Bragg's diffraction angle of the XRD peak (degree).…”
Section: Powder Xrd Analysissupporting
confidence: 88%
“…Poor crystallinity of the films may also lead to higher optical band gap. These values of optical band gap is comparable with the reported value for SnS thin films [17,18,19]. (7) and figure (8) show the variation of sensitivity vs. operating temperature at different thickness in the presence of 20 ppm ethanol gas and ammonia gas respectively.…”
Section: Optical Propertiessupporting
confidence: 87%
“…Calculated band gaps are in good accordance with the literature. 1,21,25 Band gap values calculated for 4.0% bismuth sulfide coupled SnS/Al 2 O 3 , 8.0% bismuth sulfide coupled SnS/Al 2 O 3 and 12.0% bismuth sulfide coupled SnS/Al 2 O 3 are found to be 1.85, 1.68, and 1.1 eV, respectively, as shown in Fig. 3D-F.…”
Section: Ftir Analysismentioning
confidence: 81%