2010
DOI: 10.1016/j.jpcs.2010.06.011
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Structural and optical properties of In35Sb45Se20−xTex phase-change thin films

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Cited by 6 publications
(4 citation statements)
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“…%) were prepared using a conventional melt quenching technique [23]. Typical, 10 g total (per batch) of appropriate quantities of 99.999% pure indium (In), antimony (Sb), selenium (Se) and tellurium (Te) were weighted according to their atomic percentages and sealed in quartz ampoules in a vacuum of ≈ 10 -5 Torr.…”
Section: Methodsmentioning
confidence: 99%
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“…%) were prepared using a conventional melt quenching technique [23]. Typical, 10 g total (per batch) of appropriate quantities of 99.999% pure indium (In), antimony (Sb), selenium (Se) and tellurium (Te) were weighted according to their atomic percentages and sealed in quartz ampoules in a vacuum of ≈ 10 -5 Torr.…”
Section: Methodsmentioning
confidence: 99%
“…The XRD patterns of the as-prepared thin film (thickness 150 nm) as a representative example were investigated [23]. …”
Section: Xrd Characterizationmentioning
confidence: 99%
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“…Ge-Sb-Te [6] In-Sb-Se [7] and Ag-In-SbTe [8] materials have been commercially used in rewritable optical memories. The storage mechanism is based on the change of optical properties or electrical resistance in the phase change materials, due to a reversible structural transition from an amorphous state to a crystalline state [6][7][8][9]. It has been reported that, the ternary AgSbSe 2 compound crystallizes with NaCl type structure possesses a number of desired phase change properties [10,11].…”
Section: Introductionmentioning
confidence: 99%