Structural and optical study of RF-magnetron sputtering SnO2 thin films: impact of post annealing temperature
Natasha Sajdeh,
Seyed Ali Asghar Terohid,
Somayeh Asgary
et al.
Abstract:Tin oxide (SnO2) thin films are prepared using radio frequency magnetron sputtering (RF) method and then annealed at different temperatures in the range of 550–750 ∘C for 1 hour. The effects of annealing temperature on the structural and optical properties of the films are investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and spectrophotometer. It is evident that the annealed films have flat surface with smooth morphology. Based on the XRD graph, as d… Show more
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