2011
DOI: 10.1016/j.tsf.2010.11.011
|View full text |Cite
|
Sign up to set email alerts
|

Structural and photocarrier radiometric characterization of Cux(CdTe)yOz thin films growth by reactive sputtering

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2013
2013
2017
2017

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 16 publications
0
2
0
Order By: Relevance
“…The crystalline quality of the sample can be determined by using FWHM value of the main XRD peak which, in the case of HAp, is located at 31.773° and corresponds to the (211) direction. This parameter is inversely proportional to the average crystalline size according to the Scherrer equation; indicating that for FWHM small values, the crystallinity quality increases or maybe that the polycrystalline samples undergo a re‐crystallization process. In order to have more detailed information about changes in the structural properties of these samples as a function of the cooling rate, Figure (A) shows the (211) peak for all studied samples, and the vertical dash line represents the position of the (211) peak according to the JCPD file No.…”
Section: Resultsmentioning
confidence: 99%
“…The crystalline quality of the sample can be determined by using FWHM value of the main XRD peak which, in the case of HAp, is located at 31.773° and corresponds to the (211) direction. This parameter is inversely proportional to the average crystalline size according to the Scherrer equation; indicating that for FWHM small values, the crystallinity quality increases or maybe that the polycrystalline samples undergo a re‐crystallization process. In order to have more detailed information about changes in the structural properties of these samples as a function of the cooling rate, Figure (A) shows the (211) peak for all studied samples, and the vertical dash line represents the position of the (211) peak according to the JCPD file No.…”
Section: Resultsmentioning
confidence: 99%
“…Temperature increase rate: Thermal process was carried out at 300 and 350°C, and two routes were considered: steady temperature Table 1 shows full width at half maximum (FWHM) values depending on function of ageing time for 300 and 350°C when treatment temperature is reached directly or by steps. The crystalline quality throughout the samples was evaluated by measuring the FWHM [18]. From the inverse of FWHM it is observed that crystalline quality increases when temperature treatment is 350°C and it is step reached.…”
Section: 2mentioning
confidence: 99%