2010
DOI: 10.1016/j.jnoncrysol.2009.12.006
|View full text |Cite
|
Sign up to set email alerts
|

Structural and thermal characterization of SiO2–P2O5 sol–gel powders upon annealing at high temperatures

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
9
0

Year Published

2011
2011
2020
2020

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 21 publications
(9 citation statements)
references
References 22 publications
0
9
0
Order By: Relevance
“…The loss of PO x itself in the deposition process is more realistic, and the remaining CaO will build up at grain boundaries [29]. Since no precipitation of CaO was observed for HAp films deposited on Si under the same sputtering conditions [41], the precipitation of CaO when using SiO 2 indicates that PO x partially diffused into SiO 2 and formed P 2 O 5 -SiO 2 compounds such as SiP 2 O 7 and Si 3 (PO 4 ) 4 [44][45][46][47]. Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The loss of PO x itself in the deposition process is more realistic, and the remaining CaO will build up at grain boundaries [29]. Since no precipitation of CaO was observed for HAp films deposited on Si under the same sputtering conditions [41], the precipitation of CaO when using SiO 2 indicates that PO x partially diffused into SiO 2 and formed P 2 O 5 -SiO 2 compounds such as SiP 2 O 7 and Si 3 (PO 4 ) 4 [44][45][46][47]. Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Tian et al [26,27] showed, by using 1 H, 13 C and 31 P solution state NMR, that no P\O\P or P\O\Si bonds were present in PO(OEt) 3 /Si(OEt) 4 sols. The presence of P\O\Si bonds was evidenced only in gels by using static 31 P NMR: the shielding of 31 P resonances (up to ≈−28 ppm, when compared to ≈0 ppm for orthophosphate species) was explained by this type of bonding.…”
Section: Discussionmentioning
confidence: 99%
“…Other physical and chemical analyses of these materials were already presented in a previous paper [13].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The structural, optical and electrical characteristics of SiO 2 -P 2 O 5 materials obtained by sol-gel methods have been studied. Various siliconphosphates structures have been formed during different preparation methods [10,11]. However, to the best of our knowledge, the fabrication of P 2 O 5 /SiO 2 silica hollow spheres has not been reported.…”
Section: Introductionmentioning
confidence: 99%