Abstract:Self-assembled indium deposition-induced nanostructures are obtained on the UHV cleaved (100) surface of In 4 Se 3 layered semiconductor crystals. The small indium-deposition rates and short deposition times are chosen to study growth orientation and origin of nanostructures observed by scanning tunnelling microscopy (STM) on the (100) surface of In 4 Se 3 after indium deposition. The shape of these nanostructures strictly depends on the overstoichiometric indium concentration level in the melt during the crys… Show more
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