2024 IEEE 42nd VLSI Test Symposium (VTS) 2024
DOI: 10.1109/vts60656.2024.10538672
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Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors

Suhas Krishna Kashyap,
Chinmaye Raghavendra,
Suriyaprakash Natarajan
et al.
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