1997
DOI: 10.1016/s0921-4534(97)01461-5
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Structural changes in HgBa2Ca2Cu3O8+δ under high pressure

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Cited by 8 publications
(8 citation statements)
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“…The compounds with square coordination have not been doped successfully but those with copper in octahedral coordination have been over-doped. 25,[51][52][53][54] Therefore, shortening the apical oxygen distance in the oxygenated superconducting (Mo,Cu)-1212 samples could worsen the hole transfer (charge transfer) from the copper chain site. On the other hand, in the T′-phase superconductor where copper is square planar coordinated, the pressure coefficient of T C is negligibly small.…”
Section: Charge Transfer Energy and Orbital Admixturementioning
confidence: 99%
See 3 more Smart Citations
“…The compounds with square coordination have not been doped successfully but those with copper in octahedral coordination have been over-doped. 25,[51][52][53][54] Therefore, shortening the apical oxygen distance in the oxygenated superconducting (Mo,Cu)-1212 samples could worsen the hole transfer (charge transfer) from the copper chain site. On the other hand, in the T′-phase superconductor where copper is square planar coordinated, the pressure coefficient of T C is negligibly small.…”
Section: Charge Transfer Energy and Orbital Admixturementioning
confidence: 99%
“…51,52 We can recall that HgBa 2 Ca 2 Cu 3 O 8+δ shows the largest T C having a large apical distance and an almost flat copper plane. 25,[51][52][53][54] Therefore, shortening the apical oxygen distance in the oxygenated superconducting (Mo,Cu)-1212 samples could worsen the hole transfer (charge transfer) from the copper chain site. Nevertheless, our TEP measurements show that the hole concentration in the CuO 2 plane increases after oxygenation in the present materials.…”
Section: Charge Transfer Energy and Orbital Admixturementioning
confidence: 99%
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“…Many reports demonstrated that the apical oxygen atom approaches the copper ion in the CuO 2 plane much faster than that expected from the contraction along the c direction under high pressure. [12][13][14][15] The structure within the space between the CuO 2 planes can be considered as a charge reservoir, whose important role is to fix the charge carriers in the CuO 2 planes with a certain density. According to the pressure-induced charge transfer (PICT) model, 16 the T c variation is ascribed to the charge transfer from the charge reservoir to the CuO 2 plane.…”
Section: Introductionmentioning
confidence: 99%