Structural characterization of supported nanocrystalline ZnO thin films prepared by dip-coating

Hong

2014

J. Ceram. Soc. Japan

The structural and electrical properties of mesoporous La 0.7 Sr 0.3 MnO 3 (LSMO) films for electrode applications were investigated as a function of annealing temperature. Mesoporous LSMO films were successfully synthesized by using solgel and evaporationinduced self-assembly processes. Metal acetates and Brij-S10 were used as the starting material and pore structure-forming template, respectively. With the adoption of mesoporous structure in the LSMO film, the surface area of mesoporous LSMO films was increased up to 165% with an annealing temperature increase from 350 to 650°C. The electrical conductivity value of mesoporous LSMO was determined to be 46 S/cm at a measurement temperature of 500°C. This greatly increased the surface area and provided reasonable electrical conductivity, which makes mesoporous LSMO films suitable as electrode materials of micro-solid oxide fuel cell devices.

Section: Resultsmentioning

confidence: 99%

Effect of annealing temperature on the structural and electrical properties of mesoporous La0.7Sr0.3MnO3

Hong

2014

J. Ceram. Soc. Japan

“…In this case, since the films are polycrystalline, the (αhν) curves correspond to crystalline material with direct allowed transitions (direct band gap) can be used to calculate the band gap by classical relation [10], αhυ = A(hυ-Eg) n , where Eg is the optical band gap. A is a constant and the exponent 'n' depends on the transition [11]. The UV-vis transmittance spectra of SnO2 thin films deposited on glass substrate at prepared substrate temperature of 400 °C and annealed temperature of 500 °C and 600 °C are shown in Fig.…”

Section: Optical Properties By Uv -Vis -Nirmentioning

confidence: 99%

“…The spray pyrolysis process has some advantage over the other techniques due to excellent compositional control homogeneity at the molecular level due to the mixing of liquids precursors and lower crystallizations temperature. At the same time the spray pyrolysis of methods offers the possibility of preparing a small as well as large area coating of SnO2 thin films at low cost for technological applications [6,7]. In this paper, the deposition and the characterization of SnO2 were reported and studied the effect of annealing temperature on standard electrical and optical properties of SnO2 thin films.…”

Section: Introductionmentioning

confidence: 99%

Annealing Effect on Nanocrystalline SnO2 Thin Films Prepared by Spray Pyrolysis Technique

Pakiyaraj¹,

Kirthika²

2021

J. Nanosci. Tech.

In recent years, a transparent conducting oxide (TCO) SnO2 semiconductor have gained considerable attention due to their potential application in gas sensors. More number of studies on TCO oxide have focused on the semiconducting metal oxides in which an intensive argument is that the transparent semiconductors. The SnO2 thin films were deposited at 400 °C and then annealed at 500 °C and 600 °C and its structural, optical and electrical properties were characterized. The doping stoichiometric ratio was maintained as 4% and the resulting solution was sprayed on glass substrate which was kept at nozzle distance of 25 cm and the spray rate was 10 mL/min. The prepared pure SnO2 thin films have been characterized by different methods such as XRD, FESEM, UV-Vis NIR and EDAX analyses. It was found that the nanocrystalline SnO2 grains possesses structural features of the tetragonal rutile structure. Hence the prepared thin films are justified to be nanocrystalline and also the mean crystalline size decreased with respect to annealing temperature.

International Journal of Spectroscopy

“…Hence, the synthesis and characterization of nc-ZnO thin films have been an active area of research and development. Nanostructured ZnO thin films can be grown by different methods such as pulsed laser deposition, CVD, MOCVD, sputtering, electrochemical deposition, sol-gel, and spray pyrolysis [6][7][8][9][10][11][12][13][14][15]. In these investigations, nc-ZnO films were deposited on pretreated p-type Si (100) wafer via spin coating technique by using 10 wt.%, 15 wt.%, and 25 wt.% zinc acetate sol concentration.…”

Section: Introductionmentioning

confidence: 99%

EPR Spectroscopy of Different Sol Concentration Synthesized Nanocrystalline-ZnO Thin Films

Arora

Zargar

Khan³

2015

Nanocrystalline zinc oxide (nc-ZnO) thin films were grown on p-type silicon substrate through spin coating by sol-gel process using different sol concentrations (10 wt.%, 15 wt.%, and 25 wt.%). These films were characterized by high resolution nondestructive X-ray diffraction (XRD), scanning electron microscopy (SEM) with energy dispersive X-ray analysis (EDS) attachment, and electron paramagnetic resonance (EPR) techniques to understand variations in structural, morphological, and oxygen vacancy with respect to sol concentration. The film surface morphology changes from nanowall to nanorods on increasing sol concentration. EPR spectra revealed the systematic variation from ferromagnetic to paramagnetic nature in these nc-ZnO films. The broad EPR resonance signal arising from the strong dipolar-dipolar interactions among impurity defects present in nc-ZnO film deposited from 10 wt.% sol has been observed and a single strong narrow resonance signal pertaining to oxygen vacancies is obtained in 25 wt.% sol derived nc-ZnO film. The concentrations of impurity defects and oxygen vacancies are evaluated from EPR spectra, necessary for efficient optoelectronic devices development.