2011
DOI: 10.1103/physrevb.84.075213
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Structural diversity and electronic properties of Cu2SnX3(X=S, Se): A fir

Abstract: The ternary semiconductors Cu2SnX3 (X=S, Se) are found frequently as secondary phases in synthesized Cu2ZnSnS4 and Cu2ZnSnSe4 samples, but previous reports on their crystal structures and electronic band gaps are conflicting. Here we report their structural and electronic properties as calculated using a first-principles approach. We find that: (i) the diverse range of crystal structures such as the monoclinic, cubic and tetragonal phases can all be derived from the zinc-blende structure with tetrahedral coord… Show more

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Cited by 182 publications
(100 citation statements)
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“…CTS consists of two motifs, Cu 2 Sn 2 and Cu 3 Sn 1 , periodically arranged and tetrahedrally bound to sulfur atoms [10]. Long range order of the motifs leads to the monoclinic structure and disorder to the cubic structure [11].…”
Section: Introductionmentioning
confidence: 99%
“…CTS consists of two motifs, Cu 2 Sn 2 and Cu 3 Sn 1 , periodically arranged and tetrahedrally bound to sulfur atoms [10]. Long range order of the motifs leads to the monoclinic structure and disorder to the cubic structure [11].…”
Section: Introductionmentioning
confidence: 99%
“…19,20 In fact, it is difficult to obtain pure phase in the Cu-Zn-Sn-S system, because the crystalline phases, including CuS, Cu 2-x S, Cu 2 S, ZnS, SnS, SnS 2 and Cu 3 SnS 4 , have similar lattice structures and formation energies as CTS and CZTS. And it is also very difficult to investigate these impurity phases by conventional X-ray diffraction (XRD) 21 and Raman techniques 22 due to the high similarity of crystal structures and local structures, especially when these structures or phases are reduced to nanometer scale. Though high-resolution transmission electron microscopy (HRTEM) techniques have tremendous advantages on the characterization of these nanostructures in the Cu-Zn-Sn-S system, detailed HRTEM investigations of the Cu-Zn-Sn-S materials were rarely reported.…”
Section: Introductionmentioning
confidence: 99%
“…Ширина запрещенной зоны экс-периментально получаемых тонких пленок CTS, отве-чающая прямым оптическим переходам, расположена в приемлемом для фотопреобразователей диапазоне: E g = 0.95−1.35 eV [1]. Материалу свойствен высокий коэффициент поглощения α > 10 6 m −1 [2,3], что спо-собствует полному поглощению света в тонких слоях ∼ 1−2 nm.…”
Section: Introductionunclassified