2022
DOI: 10.1088/1402-4896/ac5bc4
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Structural, electrical and optical properties investigation of nano-sized Sb0.1(SnO2)0.9

Abstract: Solid state reaction method are used to prepare Sbx(SnO2)1-x (x=0 and 0.1) with sintering temperatures, 600oC and 800oC. The crystallographic properties of undoped and doped SnO2 materials results showed the tetragonal rutile structure of SnO2. The crystallinity was clear and increased with increasing the heat treatment. For the most diffraction peaks the microstrain is negative because do˂ds indicating the generation of residual compressive stress in the surface. Rietveld refinement proved that a good fitting… Show more

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Cited by 6 publications
(3 citation statements)
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“…Despite the rising temperature, the magnetic susceptibility gradually decreases because of the increased thermal fluctuation of the spins, and eventually, the system experiences the FM to PM transition at T C . [ 48 ]…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Despite the rising temperature, the magnetic susceptibility gradually decreases because of the increased thermal fluctuation of the spins, and eventually, the system experiences the FM to PM transition at T C . [ 48 ]…”
Section: Resultsmentioning
confidence: 99%
“…A homemade apparatus described in our earlier study was used to measure the thermoelectric power. [ 48,49 ] A double‐beam UV–vis–NIR spectrophotometer (Model: JASCO, V‐570 in a range of wavelength from 200 to 2500 nm) was utilized to study the reflection properties of our samples. By using the Barrington instruments MS2/MS3 susceptibility system described in our earlier study, [ 50,51 ] the AC susceptibility of the compounds was examined over the temperature range of 100–400 K in a 250 T magnetic field with a frequency of 0.3 kHz.…”
Section: Methodsmentioning
confidence: 99%
“…In the temperature range of 80-290K, the usual four-point approach was used to measure the temperature dependency of resistivity with and without magnetic field (0, 0.6 & 1.15 Tesla) using Oxford Instruments Limited (Oxford OX20DX). The optical properties were measured using a Jasco V-570 twin beam UV-visible-NIR spectrometer [17]. Utilizing LCR meters of the Hioki IM3536 type, the dielectric properties were studied.…”
Section: Methodsmentioning
confidence: 99%