2009
DOI: 10.1016/j.tsf.2008.09.076
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Structural, electronic and optical properties of (Sc,Y)N solid solutions

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Cited by 30 publications
(27 citation statements)
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“…This result confirms that even at high temperature, ScN and YN will tend to phase separate if diffusion is activated in the system. Experimentally, thin films of Sc 1Àx Y x N solid solutions have been deposited by Gregoire et al 50 As can be seen in Fig. 1(b) the measured lattice spacing has good agreement with our calculations which is a strong indication that the films are solid solutions and not phase separated.…”
Section: Resultssupporting
confidence: 81%
“…This result confirms that even at high temperature, ScN and YN will tend to phase separate if diffusion is activated in the system. Experimentally, thin films of Sc 1Àx Y x N solid solutions have been deposited by Gregoire et al 50 As can be seen in Fig. 1(b) the measured lattice spacing has good agreement with our calculations which is a strong indication that the films are solid solutions and not phase separated.…”
Section: Resultssupporting
confidence: 81%
“…The implanted dose of Mg was adjusted for each energy by controlling the duration of the implantation while maintaining a current beam density not exceeding 5A.cm -2 to avoid a temperature increase of the ScN films during the implantation process. Table 1 [32]. A higher presence of oxygen in the film leads to the accumulation of oxygen at the grain boundaries and defects [18].…”
Section: Methodsmentioning
confidence: 99%
“…Table 2. The lower (absolute) value of the Seebeck coefficient for ScN compared to earlier reported ScN films, is most likely due to the higher amount of oxygen contamination present in the film, especially the presence of oxide at grain boundaries and/or defects [18,19,32]. A presence of oxide at grain boundaries/defects affected the thermoelectric properties with a reduced Seebeck and electrical conductivity resulting to a low power factor [18,27].…”
Section: Methodsmentioning
confidence: 99%
“…High throughput optical characterization of materials has been employed for mapping composition-dependent optical properties, including the band gap of semiconductors [151] and various performance metrics for transparent conducting oxides [152,153]. Here we focus on the relatively advanced evaluation techniques involving electrochemical and photoelectrochemical measurements.…”
Section: High Throughput Screeningmentioning
confidence: 99%