2010
DOI: 10.1016/j.jssc.2010.08.014
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Structural investigation of the Cu2Se–In2Se3–Ga2Se3 phase diagram, X-ray photoemission and optical properties of the Cu1−z(In0.5Ga0.5)1+z/3Se2 compounds

Abstract: Structures of compounds in the Cu 2 Se-In 2 Se 3-Ga 2 Se 3 system have been investigated through X-ray diffraction. Single crystal structure studies for the so-called stoichiometric compounds Cu(In,Ga)Se 2 (CIGSe) confirm that the chalcopyrite structure (space group I4¯ 2d) is very flexible and can adapt itself to the substitution of Ga for In. On the other hand a structure modification is evidenced in the Cu 1Àz (In 0.5 Ga 0.5) 1+z/3 Se 2 series when the copper vacancy ratio (z) increases; the chalcopyrite st… Show more

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Cited by 36 publications
(22 citation statements)
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References 35 publications
(41 reference statements)
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“…This leads to a compound close to Cu 2 (In,Ga) 5 Se x . The shoulders visible in the grazing incidence XRD (noted Ψ) indicate the presence of this Cu‐depleted phase, as previously observed by Szaniawski and Souilah . Using the pseudo‐ternary diagram from the latter to estimate the corresponding amount of Se in the second phase, we obtain a stoichiometry of 2:5:8.5.…”
Section: Discussionsupporting
confidence: 79%
“…This leads to a compound close to Cu 2 (In,Ga) 5 Se x . The shoulders visible in the grazing incidence XRD (noted Ψ) indicate the presence of this Cu‐depleted phase, as previously observed by Szaniawski and Souilah . Using the pseudo‐ternary diagram from the latter to estimate the corresponding amount of Se in the second phase, we obtain a stoichiometry of 2:5:8.5.…”
Section: Discussionsupporting
confidence: 79%
“…ODC-related phases, comparing to that of the chalcopyrite structure. 15,16 This finding is consistent with results of several authors: a continuous decrease of the tetragonal unit cell parameter as a function of Cu-deficiency in the film has been reported for the Cu(In,Ga)Se 2 single crystal 17 and also for physical vapor deposited Cu(In, Ga)Se 2 thin film. 18 The reduction of the lattice parameter was attributed to the structural modification to more Cu-poor phases.…”
Section: þ2supporting
confidence: 91%
“…Of course, the degree of the Cu-depletion strictly depends on the order of the Cu-deficiency at the bulk region of the film. The presence of the Cu-depleted surface layer has already been detected by the modeling of the grazing incidence x-ray diffraction for the polycrystalline Cu(In,Ga)Se 2 thin film 18 and also for the Cu(In,Ga)Se 2 powder compound, 17 as evidenced by the x-ray photoemission spectroscopy study. Therefore, the Cu-poor surface region appears to be a general phenomenon in CIGSbased material.…”
Section: þ2mentioning
confidence: 78%
“…Table 1 presents the structural data of monocrystalline CuInSe 2 [29,[43][44][45][46], Table 2 shows data obtained by powder diffraction structure refinement using Rietveld or Le Bail method [15,23,[47][48][49][50][51][52][53][54], Table 3 provides data obtained by powder and single crystal diffraction using traditional methods [16,27,28,55,56] and Table 4 provides data for thin films and nanocrystals [57][58][59][60][61][62][63]; more data for comparison can be found in [15,48,64] (in the last reference, theoretical values have also been considered). In Fig.…”
Section: Structure Of Cuinse 2 At Ambient Temperaturementioning
confidence: 99%