Structural investigations of submicrocrystalline metals obtained by high-pressure torsion deformation

Kužel, R.; Matěj, Zdeněk; Cherkaska, V.; Pešička, Josef; Čı́žek, Jakub; Procházka, I.; Исламгалиев, Р. К.

doi:10.1016/j.jallcom.2003.12.048

Cited by 18 publications

(13 citation statements)

References 16 publications

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“…It was found that the dislocation density increases with increasing numbers of ECAP passes and saturates after 4-8 passes for both pure fcc metals and solid solutions [45,[65][66][67][68][69][70][71]. As an example, the dislocation density versus the imposed strain for an Al-3% Mg specimen is plotted in Fig.…”

Section: Evolution Of Microstructure During Ecapmentioning

confidence: 99%

Characteristics of face-centered cubic metals processed by equal-channel angular pressing

2007

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This review surveys the characteristics of face-centered cubic (fcc) metals and alloys processed by equal-channel angular pressing (ECAP). The significance of the Hall-Petch relationship for ultrafine grained structures is examined and the dependence of the saturated stress obtained in ECAP on the absolute melting temperature is described and discussed. In addition, the flow processes at low temperatures in ultrafine-grained materials and the microstructural evolution of the dislocation densities and precipitates in some alloys of practical importance are also considered briefly.

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Section: Evolution Of Microstructure During Ecapmentioning

confidence: 99%

Characteristics of face-centered cubic metals processed by equal-channel angular pressing

2007

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“…The size and size-distribution of crystallites, grains, or subgrains, and the dislocation structure were studied intensively in different metals and alloys, e.g. Al [69], Al-alloys [69][70][71], Cu [72][73][74][75][76][77][78], or Ni [79][80][81], processed by SPD procedures at room temperature, e.g. by equal channel angular pressing (ECAP) or high pressure torsion (HPT).…”

Section: 5mentioning

confidence: 99%

Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár¹,

Gubicza²

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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Abstract. X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

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“…Dislocations have been intensively studied in cubic metals [69] (Al [70], Al-alloys [70][71][72], Cu [73][74][75][76][77][78][79][80], Ni [81][82][83]) processed at room temperature by SPD procedures, e.g. by equal-channel angular pressing (ECAP) or high-pressure torsion (HPT).…”

Section: Dislocation Structure In Cubic Nanomaterialsmentioning

confidence: 99%

Microstructure of Bulk Nanomaterials Determined by X‐Ray Line‐Profile Analysis

Ungár¹,

Schafler²,

Gubicza

2009

Bulk Nanostructured Materials

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The physical properties of structural materials are determined by their microstructure. The microstructure can be investigated either by direct methods, especially transmission or scanning electron microscopy (TEM or SEM), or by the indirect methods, like X-ray line-profile analysis (XLPA), differential scanning calorimetry (DSC), residual electrical resistivity (RER) or the different methods of mechanical testing. All these methods, irrespective of whether direct or indirect, reflect different aspects of the different microstructure features. The more methods that are used, the more comprehensive will be the microstructure characterization. In the present work the method of XLPA is summarized and discussed in comparison with other methods listed here. It is attempted to reveal how XLPA can contribute to a more complete characterization of the microstructure of bulk nanomaterials, especially when combined with other methods. General Concept and the Basic Ideas of X-ray Line-profile AnalysisWithin the framework of the kinematical scattering theory, the ideal diffraction pattern of a polycrystalline specimen consists of narrow, symmetrical, deltafunction-like peaks at the positions of the exact Bragg angles according to the well-defined unit cell of the crystal

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Structural investigations of submicrocrystalline metals obtained by high-pressure torsion deformation

Cited by 18 publications

References 16 publications

Characteristics of face-centered cubic metals processed by equal-channel angular pressing

Characteristics of face-centered cubic metals processed by equal-channel angular pressing

Nanocrystalline materials studied by powder diffraction line profile analysis

Microstructure of Bulk Nanomaterials Determined by X‐Ray Line‐Profile Analysis

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