Structural, magnetic, electrical and optical studies of Cr doped nanostructured ZnO thin films for spintronics application

Prajapati, Ramesh; Gautam, Shubham; Surve, Sachin; Shukla, V N

doi:10.1088/2053-1591/ab3879

Cited by 4 publications

(1 citation statement)

References 22 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…6). In addition to being in good agreement with the data reported in the literature, it should be noted that some studies have reported even larger values for these parameters [26,27]. Here, it became evident that the electrical resistivity decreased in the ZC-3 thin film, but significantly increased in the ZC-6 and ZC-9 thin films as the doping concentration increased.…”

Section: Electrical Analysissupporting

confidence: 91%

Enhancing Physical Properties: Chromium-Doped Zinc Oxide Thin Films Deposited by Ultrasonic Spray Pyrolysis

Gunes,

Sarica,

Bilgin

2023

jbst

View full text Add to dashboard Cite

In this study, undoped and different concentrations (3%, 6%, and 9%) of chromium-doped ZnO thin films were deposited using the ultrasonic spray pyrolysis technique, and the significant effects of the dopant concentration on the physical properties of the deposited films, including structural, morphological, and electrical characteristics, were investigated. The structural analysis revealed that the thin films possessed a hexagonal wurtzite structure, and the intensity of the peak corresponding to the (002) plane initially increased with the increasing dopant concentration, then decreased, and increased again. Morphological analysis showed that there were no regular changes in the crystal sizes with increasing dopant concentration, but noticeable alterations occurred on the film surfaces. The optical band gaps of the deposited films increased from 3.24 eV to 3.31 eV with the increasing dopant concentration. The electrical resistivity values of the films varied between 3.04x10 1 Ωcm and 3.35x10 6 Ωcm, indicating that higher dopant concentrations led to an increase in resistivity.

show abstract

Section: Electrical Analysissupporting

confidence: 91%