2019
DOI: 10.1007/s11664-019-07674-w
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Structural, Optical and Dielectric Properties of Aluminoborosilicate Glasses

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Cited by 18 publications
(9 citation statements)
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“…The obtained values indicated the more structure defects on increasing the concentration of La 2 O 3. Davis and Mott suggested that the E u values lie between 0.045-0.66 eV for amorphous (semiconducting) materials [47]. Hence, in the present studied glasses the defects (disorder) increased due the incorporation of modifiers as well as former La 2 O 3 inside the glass system.…”
Section: Raman Spectroscopic Analysismentioning
confidence: 57%
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“…The obtained values indicated the more structure defects on increasing the concentration of La 2 O 3. Davis and Mott suggested that the E u values lie between 0.045-0.66 eV for amorphous (semiconducting) materials [47]. Hence, in the present studied glasses the defects (disorder) increased due the incorporation of modifiers as well as former La 2 O 3 inside the glass system.…”
Section: Raman Spectroscopic Analysismentioning
confidence: 57%
“…The Molar Refractivity (R m ) of the prepared glasses depends on V m and optical energy gap (E g ind ), evaluated by the following mentioned relation [43,47];…”
Section: Optical Propertiesmentioning
confidence: 99%
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