2019
DOI: 10.1016/j.materresbull.2019.03.005
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Structural, optical and electrical properties of the fabricated Schottky diodes based on ZnO, Ce and Sm doped ZnO films prepared via wet chemical technique

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Cited by 32 publications
(12 citation statements)
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“…Similar results were previously observed by M.A.M. Ahmed et al [ 61 ]. The crystallite size decreased as the content of Yb and Ce increased.…”
Section: Discussionsupporting
confidence: 93%
“…Similar results were previously observed by M.A.M. Ahmed et al [ 61 ]. The crystallite size decreased as the content of Yb and Ce increased.…”
Section: Discussionsupporting
confidence: 93%
“…Region II represents the intermediate forward voltage around 0.1 < V < 1. The current observed in this region grew exponentially with voltage according to equation I ~exp V , suggesting that recombination tunneling may be the underlying transport mechanism [ 10 ]. This mechanism is typically seen in wide band gap semiconductors.…”
Section: Resultsmentioning
confidence: 99%
“…The alteration of the structural, optical, and electrical characteristics of ZnO with a suitable dopant may be a practical and efficient method for enhancing device performance. In recent years, rare-earth elements (REEs), including Gd [ 5 , 6 ], Eu [ 7 ], Tb [ 8 ], Ce [ 9 ], Sm [ 10 ], Dy [ 11 ], and Nd [ 12 ], have been reported as dopants of ZnO, in order to create new types of diluted magnetic semiconductors (DMSs). This is because they can significantly improve the conductivity, luminosity, and magnetic properties, with the long lifetime of excited state and multiple valence electrons.…”
Section: Introductionmentioning
confidence: 99%
“…It was observed that, after Sn doping, the drastic decrement in n value was noted as mentioned in Table 4. The obtained values of ideality factor (n) for all the devices are significantly above the unity (n = 1 for ideal diode) which could be attributed to voltage drop across metal/semiconductor interface and also the possible series resistance of the active layer [26]. We have observed a decrease in the ideality factor (n) for the Cu/TZO junction, which could be attributed to improved carrier concertation following Sn doping.…”
Section: Electrical Studiesmentioning
confidence: 70%