2013
DOI: 10.1002/pssb.201349183
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Structural, optical, electrical and low temperature thermoelectric properties of degenerate polycrystalline Cu7Se4 thin films

Abstract: Polycrystalline copper selenide thin films of composition Cu7Se4 with thickness of the order of 350 nm are deposited on glass substrates at a temperature of 498 ± 5 K and pressure of 10−5 mbar using reactive evaporation with high purity copper (99.999%) and selenium (99.99%) as the elemental starting materials. X‐ray diffraction (XRD) shows the formation of Cu7Se4 thin films. Structural parameters such as lattice constant, particle size, dislocation density, number of crystallites per unit area and strain in t… Show more

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Cited by 22 publications
(12 citation statements)
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“…It is also noticed that the Seebeck coefficient of the films increases with the temperature, which is consistent for a degenerate semiconductor. This observation is in well agreement with the general fact that higher conductivity exhibits low thermoelectric power [36].…”
Section: Thermoelectric Propertiessupporting
confidence: 92%
“…It is also noticed that the Seebeck coefficient of the films increases with the temperature, which is consistent for a degenerate semiconductor. This observation is in well agreement with the general fact that higher conductivity exhibits low thermoelectric power [36].…”
Section: Thermoelectric Propertiessupporting
confidence: 92%
“…This technique provides stoichiometric films with excellent reproducibility, uniform deposition, large-area production and high deposition rate. The detailed experimental procedure has been described elsewhere [18]. Briefly, high-purity indium (99.999 %) and selenium (99.99 %) were evaporated simultaneously at suitable rates from two independently heated sources and were allowed to deposit on glass substrates kept at an elevated temperature of 473 ± 5 K. The deposition of thin film was carried out at a pressure of 10 -5 mbar.…”
Section: Methodsmentioning
confidence: 99%
“…The average crystallite size of the prepared InSe thin film was calculated using Scherrer equation [20] and was obtained as 48 ± 2 nm. The microstructural parameters such as dislocation density, number of crystallites per unit area and lattice strain in the film were estimated as 4.34 9 10 10 lines cm -2 , 15.37 9 10 10 cm -2 and 1.8 9 10 -3 , respectively [18]. Figure 2 shows the EDAX spectrum of the prepared InSe thin film.…”
Section: Methodsmentioning
confidence: 99%
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“…Okimura et al [6] prepared Cu 2-x Se-Si junction by conventional vacuum evaporation method and reported that the conversion efficiency of the junction is about 8.3 and 8.8 % for 3-and 2-mm-diameter Cu 2-x Se layer, respectively. Several chemical and physical methods such as chemical bath [2,[7][8][9][10][11], aerosol-assisted chemical vapor deposition [12,13], electroless [14], solgel [15], electrochemical deposition [16], electrophoretic deposition [17], brush electroplate deposition [18], cathodic deposition [19], dip coating [20], spray pyrolysis [21], vacuum co-evaporation [22], vacuum evaporation [6,23], pulsed laser deposition [4,24], selenization [25], magnetron sputtering [26], flash evaporation [27] and reactive evaporation [28] methods have been employed to deposit copper selenide thin films. Ting and Lee [17] prepared Cu 2-x Se nanocrystals by one-pot solution-phase method.…”
Section: Introductionmentioning
confidence: 99%