“…Since then, preferred orientation has been a part of Rietveld refinement because the method is well suited to low-symmetry compounds with many closely spaced and partially overlapped peaks, whereas it is still difficult to measure quantitative pole figures for complex X-ray powder diffraction (XRD) and ND data for such materials. The March model (Dollase, 1986; O’Connor et al , 1991, 1992; Sitepu, 1991, 1998, 2002; Sitepu, O’Connor, and Li, 2004, 2005), the generalized spherical-harmonic (GSH) description (Ahtee et al , 1989; Popa, 1992; Järvinen, 1993; Von Dreele, 1997; Bergmann et al , 2001; Sitepu et al , 2001; Sitepu, Schmahl, and Allafi et al , 2002; Sitepu, Schmahl, and Stalick, 2002; Sitepu, Schmahl, and Von Dreele, 2002; Sitepu, 2003, 2007, 2008; Sitepu, O’Connor, Benmarouane et al , 2004), and the Williams-Imhof-Matthies-Vinel method (Matthies et al , 1988, 1997; Lutterotti et al , 2004) have been successfully used to describe the texture resulting from packing effects in Bragg-Brentano and Debye-Scherrer powder diffraction measurements using Rietveld refinement programs. The descriptions of the BGMN , DBWS , FULLPROF , GSAS , LHPM , MAUD , and NXD programs and links to them can be obtained via the Collaborative Computational Project, No.…”