2014
DOI: 10.1016/j.saa.2013.08.090
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Structural, spectroscopic and electrical studies of nanostructured porous ZnO thin films prepared by pulsed laser deposition

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Cited by 38 publications
(13 citation statements)
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“…8 k = αλ 4π (6) where α is the absorption coefficient and λ is the wave length of light [14]. The low values of the extinction coefficient for the annealed films in the visible and near infrared region show their surface smoothness and high transmittance [23]. This indicates that the annealed films are smoother and more transparent than the deposited film at 0 h. One of the important optical parameters for ZnO thin film is its refractive index.…”
Section: Optical Propertiesmentioning
confidence: 99%
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“…8 k = αλ 4π (6) where α is the absorption coefficient and λ is the wave length of light [14]. The low values of the extinction coefficient for the annealed films in the visible and near infrared region show their surface smoothness and high transmittance [23]. This indicates that the annealed films are smoother and more transparent than the deposited film at 0 h. One of the important optical parameters for ZnO thin film is its refractive index.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…This indicates that the annealed films are smoother and more transparent than the deposited film at 0 h. One of the important optical parameters for ZnO thin film is its refractive index. The refractive index is closely related to the electronic polarizability of ions and the local field inside the material [23]. The refractive index (n) can be calculated according to the following relation and is shown in Fig.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…Several works highlighted the importance in using specific oxygen background gas pressures during ablation of the material source, if a porous structure want to be pursued [44][45][46][47]. For example, dense and porous ZnO thin films were obtained at room temperature on silicon (Si) substrates in vacuum and in 100 mTorr O 2 , respectively.…”
Section: Pulsed Laser Depositionmentioning
confidence: 99%
“…The crystallite size (D hkl ) of synthesized gyrolite was calculated from the line broadening using Scherrer's equation [37]: where λ is the wavelength of the Cu Kα radiation (0.154056 nm), θ is the Bragg's diffraction angle, B hkl is the full width at half maximum intensity of the gyrolite (001) reflection peak 2θ~3.95˚, and k is a constant (the value used in this study was 0.94). It was found that by prolonging the synthesis time up to 168 h the crystallite size and diffraction peak area (001) of gyrolite increase to 95 nm and 39 a.u., respectively ( Fig.…”
Section: Gyrolite Hydrothermal Synthesismentioning
confidence: 99%