2018
DOI: 10.1021/acsami.8b00427
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Structurally Controlled Large-Area 10 nm Pitch Graphene Nanomesh by Focused Helium Ion Beam Milling

Abstract: Graphene nanomesh (GNM) is formed by patterning graphene with nanometer-scale pores separated by narrow necks. GNMs are of interest due to their potential semiconducting characteristics when quantum confinement in the necks leads to an energy gap opening. GNMs also have potential for use in phonon control and water filtration. Furthermore, physical phenomena, such as spin qubit, are predicted at pitches below 10 nm fabricated with precise structural control. Current GNM patterning techniques suffer from either… Show more

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Cited by 35 publications
(37 citation statements)
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“…Some contaminations were found on the suspended GNMs, which prevented the helium ion beam drilling the nanopores. With this kind of large area meshing, the fraction of missing-nanopore rate was relatively low compared with our previous work [32]. In that case, the effect from missing-nanopore to the conductance of GNMs was negligible.…”
Section: Device Fabrication and Methodsmentioning
confidence: 67%
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“…Some contaminations were found on the suspended GNMs, which prevented the helium ion beam drilling the nanopores. With this kind of large area meshing, the fraction of missing-nanopore rate was relatively low compared with our previous work [32]. In that case, the effect from missing-nanopore to the conductance of GNMs was negligible.…”
Section: Device Fabrication and Methodsmentioning
confidence: 67%
“…The nanopore The GNMs were patterned by HIBM on the suspended GNRs in a high vacuum chamber (< 5 × 10 −7 mbar), as shown in Figure 3a. In order to maintain consistent nanopore dimensions and investigate the effect of the nanopores pitch (center to center) for the electrical transport properties of the GNMs, the beam current was kept at 1 pA and the dwell time was kept at 45000 µs based on our previous work [32], where dwell time is how long the beam stays in one nanopore. After patterning, the GNMs were checked directly with the HIB secondary electron microscopy.…”
Section: Device Fabrication and Methodsmentioning
confidence: 99%
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